Focused ion beam imaging of laser ablation sub-surface effects on layered materials

Helena Téllez, José M. Vadillo, Richard J. Chater, J. Javier Laserna, David S. McPhail

    研究成果: Contribution to journalArticle査読

    5 被引用数 (Scopus)

    抄録

    The focussed ion beam (FIB) represents a useful and versatile tool to allow visualization of sub-surface features related to the thermal effects of laser-target interaction with high spatial resolution. The possibility of performing a contamination-free milling process on specific sample locations provides significant advantage over conventional metallurgical procedures involving cutting and polishing. In particular, the direct visualization of the thermal features occurring at fluences below the phase explosion allows a deeper understanding of the extension of the laser heat-affected zone, the sub-surface alloying processes and additional features related to the photo-thermal mechanism of laser ablation.

    本文言語英語
    ページ(範囲)2265-2269
    ページ数5
    ジャーナルApplied Surface Science
    255
    5 PART 1
    DOI
    出版ステータス出版済み - 12 30 2008

    All Science Journal Classification (ASJC) codes

    • 化学 (全般)
    • 凝縮系物理学
    • 物理学および天文学(全般)
    • 表面および界面
    • 表面、皮膜および薄膜

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