TY - JOUR
T1 - Gate drive circuit for current balancing of parallel-connected SiC-JFETs under avalanche mode
AU - Takamori, Taro
AU - Wada, Keiji
AU - Saito, Wataru
AU - Nishizawa, Shin ichi
N1 - Publisher Copyright:
© 2020 Elsevier Ltd
PY - 2020/11
Y1 - 2020/11
N2 - This paper proposes a gate drive circuit for the current balancing of parallel-connected SiC-JFETs under avalanche mode. For a solid-state DC circuit breaker, the power devices have to be connected in parallel to reduce the ON-resistance and increase the current rating. In addition, it is reported that the SiC-JFET is suitable power devices from the viewpoint of both conduction loss and long-term reliability. This paper presents the behavior of current balancing of SiC-JFETs in parallel, and then proposes a design procedure of gate drive circuits. The gate drive circuits can achieve the current balance equalization of parallel-connected SiC-JFETs under avalanche mode. The validity of the proposed gate drive circuit is verified by the experiment that uses 1.2 kV SiC-JFETs in a 400 V system.
AB - This paper proposes a gate drive circuit for the current balancing of parallel-connected SiC-JFETs under avalanche mode. For a solid-state DC circuit breaker, the power devices have to be connected in parallel to reduce the ON-resistance and increase the current rating. In addition, it is reported that the SiC-JFET is suitable power devices from the viewpoint of both conduction loss and long-term reliability. This paper presents the behavior of current balancing of SiC-JFETs in parallel, and then proposes a design procedure of gate drive circuits. The gate drive circuits can achieve the current balance equalization of parallel-connected SiC-JFETs under avalanche mode. The validity of the proposed gate drive circuit is verified by the experiment that uses 1.2 kV SiC-JFETs in a 400 V system.
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U2 - 10.1016/j.microrel.2020.113776
DO - 10.1016/j.microrel.2020.113776
M3 - Article
AN - SCOPUS:85096354084
VL - 114
JO - Microelectronics and Reliability
JF - Microelectronics and Reliability
SN - 0026-2714
M1 - 113776
ER -