>1.8 millisecond effective lifetime in n-type silicon grown by the noncontact crucible method

Maulid Kivambe, Douglas M. Powell, Mallory Ann Jensen, Ashley E. Morishige, Kazuo Nakajima, Ryota Murai, Kohei Morishita, Tonio Buonassisi

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

抄録

We evaluate the performance and gettering response of n-type ingot silicon material grown by the noncontact crucible method for photovoltaic applications. As-grown lifetimes are >150 μs and relatively homogeneous through the ingot. We apply standard and extended gettering profiles to elucidate gettering response. Effective minority carrier lifetimes are greater than 700 μs and 1.8 ms at an injection condition of 1015 cm-3 after standard and extended gettering schemes, respectively, on samples from near the top of an ingot. Unlike the as-grown state, the wafer lifetime distribution in gettered samples is not homogeneous. In wafers from lower parts of the ingot, concentric-swirl patterns of lower lifetime are revealed after gettering. We hypothesize that gettering removes a large percentage of fast-diffusing impurities, while defect striations similar to swirl microdefects found in Czochralski silicon can in some cases continue to limit lifetimes after gettering. These results indicate that, by application of a tailored gettering process, silicon materials grown by the noncontact crucible method can achieve lifetimes that can readily support high-efficiency solar cells, while highlighting areas for further material improvement.

本文言語英語
ホスト出版物のタイトル2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
出版社Institute of Electrical and Electronics Engineers Inc.
ページ2988-2990
ページ数3
ISBN(電子版)9781479943982
DOI
出版ステータス出版済み - 10 15 2014
外部発表はい
イベント40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, 米国
継続期間: 6 8 20146 13 2014

出版物シリーズ

名前2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

その他

その他40th IEEE Photovoltaic Specialist Conference, PVSC 2014
Country米国
CityDenver
Period6/8/146/13/14

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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