High launch switching activity reduction in at-speed scan testing using CTX: A clock-gating-based test relaxation and x-filling scheme

Engineering

• Switching Activity 100%
• Stages 75%
• Yields 50%
• Testing 50%
• Losses 50%
• Scan Speed 50%
• Reduction 25%
• Performance 25%
• Control Signal 25%
• Small Number 25%
• Input Value 25%
• Test Stimulus 25%
• Circuit Design 25%
• Output Value 25%

Computer Science

• Switching Activity 100%
• Testing 50%
• Control Signal 25%
• Power Supply Noise 25%
• Test Compression 25%
• Test Data Volume 25%
• Fault Coverage 25%
• Don't Care (X) 25%

Physics

• Performance 25%
• Impact 25%