Identification of device degradation positions in multi-layered phosphorescent organic light emitting devices using water probes

Hitoshi Yamamoto, Chihaya Adachi, Michael S. Weaver, Julie J. Brown

研究成果: Contribution to journalArticle査読

28 被引用数 (Scopus)

抄録

We exposed regions of green phosphorescent organic light emitting devices (PHOLED TMs) consisting of a fac-tris(2-phenylpyridine)iridium (Ir(ppy) 3) as the phosphorescent emitter to a partial pressure of water of 3 × 10 -4 Pa during device fabrication to induce degradation in a specific region of the multi-layered devices. We identified the interface between the hole transport layer and the emissive layer as the most susceptive region to degradation. We discuss the luminance loss mechanism and estimate an operational lifetime of 10 000 h, after 20 loss of the initial luminance from 1000 cd/m 2, is attainable from an Ir(ppy) 3 PHOLED fabricated under ultra-high vacuum conditions.

本文言語英語
論文番号183306
ジャーナルApplied Physics Letters
100
18
DOI
出版ステータス出版済み - 4 30 2012

All Science Journal Classification (ASJC) codes

  • 物理学および天文学(その他)

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