Identification of native defects around grain boundary in Pr-doped ZnO bicrystal using electron energy loss spectroscopy and first-principles calculations

Yukio Sato, Teruyasu Mizoguchi, Fumiyasu Oba, Masatada Yodogawa, Takahisa Yamamoto, Yuichi Ikuhara

研究成果: ジャーナルへの寄稿学術誌査読

32 被引用数 (Scopus)

抄録

Electron energy loss spectroscopy and first-principles calculations were used to analyze the native defects and Pr dopant around grain boundaries in Pr-doped and undoped ZnO bicrystals. It was observed that the Pr-doped bicrystal exhibited a nonlinear current-voltage characteristic, whereas the undoped bicrystal shows an ohmic characteristic. Pr was found to be present within 8 nm around the grain boundary in the Pr-doped bicrystal. The results show that the EELS investigation of native defects combined with first-principles calculations indicate the presence of zinc vacancies in the vicinity of the Pr-doped grain boundary.

本文言語英語
ページ(範囲)5311-5313
ページ数3
ジャーナルApplied Physics Letters
84
26
DOI
出版ステータス出版済み - 6月 28 2004
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 物理学および天文学(その他)

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