Image contrast enhancement of Ni/YSZ anode during the slice-and-view process in FIB-SEM

Shu Sheng Liu, Akiko Takayama, Syo Matsumura, Michihisa Koyama

研究成果: Contribution to journalArticle査読

4 被引用数 (Scopus)

抄録

Focused ion beam-scanning electron microscopy (FIB-SEM) is a widely used and easily operational equipment for three-dimensional reconstruction with flexible analysis volume. It has been using successfully and increasingly in the field of solid oxide fuel cell. However, the phase contrast of the SEM images is indistinct in many cases, which will bring difficulties to the image processing. Herein, the phase contrast of a conventional Ni/yttria stabilized zirconia anode is tuned in an FIB-SEM with In-Lens secondary electron (SE) and backscattered electron detectors. Two accessories, tungsten probe and carbon nozzle, are inserted during the observation. The former has no influence on the contrast. When the carbon nozzle is inserted, best and distinct contrast can be obtained by In-Lens SE detector. This method is novel for contrast enhancement. Phase segmentation of the image can be automatically performed. The related mechanism for different images is discussed.

本文言語英語
ページ(範囲)326-332
ページ数7
ジャーナルJournal of Microscopy
261
3
DOI
出版ステータス出版済み - 3 1 2016

All Science Journal Classification (ASJC) codes

  • 病理学および法医学
  • 組織学

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