Impact of nuclear reaction models on neutron-induced soft error rate analysis

Shin Ichiro Abe, Ryotaro Ogata, Yukinobu Watanabe

研究成果: ジャーナルへの寄稿記事

10 引用 (Scopus)

抄録

Terrestrial neutron-induced soft error rate (SER) analyses in the 25-nm design rule MOSFET are performed by means of multiscale Monte Carlo simulation with different nuclear reaction models used in PHITS code. It is clarified that a choice of nuclear reaction models has a great effect on the SER prediction. Even if the calculated production cross sections for secondary ions are the same among different reaction models, the difference in double-differential cross sections results in essential impact on the calculated SERs. Through validation of the nuclear reaction models used in PHITS code, it is concluded that the combined use of the e-mode with JENDL-4.0 below 20 MeV and the MQMD plus GEM above 20 MeV is the most suitable for the soft error simulation.

元の言語英語
記事番号6819468
ページ(範囲)1806-1812
ページ数7
ジャーナルIEEE Transactions on Nuclear Science
61
発行部数4
DOI
出版物ステータス出版済み - 1 1 2014

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Nuclear reactions
nuclear reactions
Neutrons
neutrons
Air cushion vehicles
cross sections
field effect transistors
simulation
Ions
predictions
ions

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

これを引用

Impact of nuclear reaction models on neutron-induced soft error rate analysis. / Abe, Shin Ichiro; Ogata, Ryotaro; Watanabe, Yukinobu.

:: IEEE Transactions on Nuclear Science, 巻 61, 番号 4, 6819468, 01.01.2014, p. 1806-1812.

研究成果: ジャーナルへの寄稿記事

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