Impedance measurement and equivalent circuit analysis of binary alkali silicate melts

研究成果: ジャーナルへの寄稿記事

抄録

Molten oxides such as silicate melts are used in glass manufacturing processes and the chemical structure of the melts affects their physical properties and hence, the efficiency of the process in which they are used and the quality of the manufactured product. Analysis of the chemical structures using Raman or nuclear magnetic resonance spectroscopy is time consuming due to the process of preparing quenched samples and the long relaxation time of atomic nuclei. Hence, a technique for faster structural analysis is desirable. In this study, in order to accumulate basic data for in-situ estimation of the network structures of molten oxides, we systematically investigated the relationships between the alkali oxide composition and measured impedance behavior. Nyquist plots were fitted using an equivalent circuit consisting of solution resistance, charge transfer resistance, and double layer capacitance. In the present samples, the solution resistance and charge transfer resistance decreased, and double layer capacitance increased with increasing K + concentration. These results were attributed to K + behaving as a charge carrier or the double layer becoming thinner due to increasing concentration of K + ions, which increased interfacial polarization. We observed that the solution and charge transfer resistances increased, and double layer capacitance decreased, in the order of Li, Na, and K. Hence, these resistances were dependent on the ionic radius, as well as the macrostructure of the melts.

元の言語英語
ページ(範囲)421-426
ページ数6
ジャーナルisij international
59
発行部数3
DOI
出版物ステータス出版済み - 3 1 2019

Fingerprint

Silicates
Alkalies
Electric network analysis
Equivalent circuits
Oxides
Charge transfer
Capacitance
Molten materials
Charge carriers
Structural analysis
Relaxation time
Nuclear magnetic resonance spectroscopy
Physical properties
Ions
Polarization
Glass
Chemical analysis

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

これを引用

Impedance measurement and equivalent circuit analysis of binary alkali silicate melts. / Harada, Yusuke; Saito, Noritaka; Nakashima, Kunihiko.

:: isij international, 巻 59, 番号 3, 01.03.2019, p. 421-426.

研究成果: ジャーナルへの寄稿記事

@article{f7619cd262744a728d9aad9a9d1377ef,
title = "Impedance measurement and equivalent circuit analysis of binary alkali silicate melts",
abstract = "Molten oxides such as silicate melts are used in glass manufacturing processes and the chemical structure of the melts affects their physical properties and hence, the efficiency of the process in which they are used and the quality of the manufactured product. Analysis of the chemical structures using Raman or nuclear magnetic resonance spectroscopy is time consuming due to the process of preparing quenched samples and the long relaxation time of atomic nuclei. Hence, a technique for faster structural analysis is desirable. In this study, in order to accumulate basic data for in-situ estimation of the network structures of molten oxides, we systematically investigated the relationships between the alkali oxide composition and measured impedance behavior. Nyquist plots were fitted using an equivalent circuit consisting of solution resistance, charge transfer resistance, and double layer capacitance. In the present samples, the solution resistance and charge transfer resistance decreased, and double layer capacitance increased with increasing K + concentration. These results were attributed to K + behaving as a charge carrier or the double layer becoming thinner due to increasing concentration of K + ions, which increased interfacial polarization. We observed that the solution and charge transfer resistances increased, and double layer capacitance decreased, in the order of Li, Na, and K. Hence, these resistances were dependent on the ionic radius, as well as the macrostructure of the melts.",
author = "Yusuke Harada and Noritaka Saito and Kunihiko Nakashima",
year = "2019",
month = "3",
day = "1",
doi = "10.2355/isijinternational.ISIJINT-2018-602",
language = "English",
volume = "59",
pages = "421--426",
journal = "ISIJ International",
issn = "0915-1559",
publisher = "Iron and Steel Institute of Japan",
number = "3",

}

TY - JOUR

T1 - Impedance measurement and equivalent circuit analysis of binary alkali silicate melts

AU - Harada, Yusuke

AU - Saito, Noritaka

AU - Nakashima, Kunihiko

PY - 2019/3/1

Y1 - 2019/3/1

N2 - Molten oxides such as silicate melts are used in glass manufacturing processes and the chemical structure of the melts affects their physical properties and hence, the efficiency of the process in which they are used and the quality of the manufactured product. Analysis of the chemical structures using Raman or nuclear magnetic resonance spectroscopy is time consuming due to the process of preparing quenched samples and the long relaxation time of atomic nuclei. Hence, a technique for faster structural analysis is desirable. In this study, in order to accumulate basic data for in-situ estimation of the network structures of molten oxides, we systematically investigated the relationships between the alkali oxide composition and measured impedance behavior. Nyquist plots were fitted using an equivalent circuit consisting of solution resistance, charge transfer resistance, and double layer capacitance. In the present samples, the solution resistance and charge transfer resistance decreased, and double layer capacitance increased with increasing K + concentration. These results were attributed to K + behaving as a charge carrier or the double layer becoming thinner due to increasing concentration of K + ions, which increased interfacial polarization. We observed that the solution and charge transfer resistances increased, and double layer capacitance decreased, in the order of Li, Na, and K. Hence, these resistances were dependent on the ionic radius, as well as the macrostructure of the melts.

AB - Molten oxides such as silicate melts are used in glass manufacturing processes and the chemical structure of the melts affects their physical properties and hence, the efficiency of the process in which they are used and the quality of the manufactured product. Analysis of the chemical structures using Raman or nuclear magnetic resonance spectroscopy is time consuming due to the process of preparing quenched samples and the long relaxation time of atomic nuclei. Hence, a technique for faster structural analysis is desirable. In this study, in order to accumulate basic data for in-situ estimation of the network structures of molten oxides, we systematically investigated the relationships between the alkali oxide composition and measured impedance behavior. Nyquist plots were fitted using an equivalent circuit consisting of solution resistance, charge transfer resistance, and double layer capacitance. In the present samples, the solution resistance and charge transfer resistance decreased, and double layer capacitance increased with increasing K + concentration. These results were attributed to K + behaving as a charge carrier or the double layer becoming thinner due to increasing concentration of K + ions, which increased interfacial polarization. We observed that the solution and charge transfer resistances increased, and double layer capacitance decreased, in the order of Li, Na, and K. Hence, these resistances were dependent on the ionic radius, as well as the macrostructure of the melts.

UR - http://www.scopus.com/inward/record.url?scp=85063933596&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85063933596&partnerID=8YFLogxK

U2 - 10.2355/isijinternational.ISIJINT-2018-602

DO - 10.2355/isijinternational.ISIJINT-2018-602

M3 - Article

VL - 59

SP - 421

EP - 426

JO - ISIJ International

JF - ISIJ International

SN - 0915-1559

IS - 3

ER -