Improvement of a 500 keV heavy-ion-beam probe for JIPP T-IIU tokamak

Y. Hamada, Y. Kawasumi, A. Nishizawa, K. Narihara, K. Sato, T. Seki, K. Toi, H. Iguchi, A. Fujisawa, K. Adachi, A. Ejiri, S. Hidekuma, S. Hirokura, K. Ida, K. Kawahata, M. Kojima, K. Joong, R. Kumazawa, H. Kuramoto, R. LiangT. Minami, H. Sakakita, M. Sasao, K. N. Sato, T. Tsuzuki, J. Xu, I. Yamada, T. Watari

研究成果: ジャーナルへの寄稿学術誌査読

3 被引用数 (Scopus)

抄録

Several improvements in the high-voltage heavy-ion-beam probe (HIBP) are discussed. (1) It is clearly found that the precision slide mount of the detector plates 30° parallel to the base electrode is very effective for the determination of the in-plane entrance angle of the beam in the analyzer to estimate the error in the potential measurement. (2) A two-staged optical trap in the HIBP greatly reduced the effect of the UV radiation in the analyzer. (3) A multiple-plate detector up to 13 measurement points clearly showed the direction of the propagation of the turbulence and path-integral effects.

本文言語英語
ページ(範囲)321-323
ページ数3
ジャーナルReview of Scientific Instruments
66
1
DOI
出版ステータス出版済み - 1995
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 器械工学

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