Impurity diffusion of Al and Cu in y-Fe

Osamu Taguchi, Miyuki Hagiwara, Yoshihiro Yamazaki, Yoshiaki Iijima

研究成果: ジャーナルへの寄稿記事

10 引用 (Scopus)

抄録

Impurity diffusion of Al and Cu in γ-Fe has been studied by using non-radioactive tracer elements. Penetration profiles have been determined by the lathe sectioning and the instrumental analyses, namely, absorptiometry for Al and atomic absorption analysis for Cu. Penetration curves obtained have been good for the diffusion analysis. The absorptiometry and atomic absorption analysis are found to be useful to measure the penetration profile for the impurity diffusion in metals where suitable radioisotope as a tracer is unavailable or the half-life of radioisotope is very short.

元の言語英語
ページ(範囲)91-96
ページ数6
ジャーナルDefect and Diffusion Forum
発行部数194-199 PART 1
出版物ステータス出版済み - 1 1 2001
外部発表Yes

Fingerprint

penetration
Impurities
Radioisotopes
impurities
tracers
Radioactive tracers
profiles
half life
Metals
curves
metals

All Science Journal Classification (ASJC) codes

  • Radiation
  • Materials Science(all)
  • Condensed Matter Physics

これを引用

Taguchi, O., Hagiwara, M., Yamazaki, Y., & Iijima, Y. (2001). Impurity diffusion of Al and Cu in y-Fe. Defect and Diffusion Forum, (194-199 PART 1), 91-96.

Impurity diffusion of Al and Cu in y-Fe. / Taguchi, Osamu; Hagiwara, Miyuki; Yamazaki, Yoshihiro; Iijima, Yoshiaki.

:: Defect and Diffusion Forum, 番号 194-199 PART 1, 01.01.2001, p. 91-96.

研究成果: ジャーナルへの寄稿記事

Taguchi, O, Hagiwara, M, Yamazaki, Y & Iijima, Y 2001, 'Impurity diffusion of Al and Cu in y-Fe', Defect and Diffusion Forum, 番号 194-199 PART 1, pp. 91-96.
Taguchi O, Hagiwara M, Yamazaki Y, Iijima Y. Impurity diffusion of Al and Cu in y-Fe. Defect and Diffusion Forum. 2001 1 1;(194-199 PART 1):91-96.
Taguchi, Osamu ; Hagiwara, Miyuki ; Yamazaki, Yoshihiro ; Iijima, Yoshiaki. / Impurity diffusion of Al and Cu in y-Fe. :: Defect and Diffusion Forum. 2001 ; 番号 194-199 PART 1. pp. 91-96.
@article{b7898eae850f4da79b3dd01b97a79358,
title = "Impurity diffusion of Al and Cu in y-Fe",
abstract = "Impurity diffusion of Al and Cu in γ-Fe has been studied by using non-radioactive tracer elements. Penetration profiles have been determined by the lathe sectioning and the instrumental analyses, namely, absorptiometry for Al and atomic absorption analysis for Cu. Penetration curves obtained have been good for the diffusion analysis. The absorptiometry and atomic absorption analysis are found to be useful to measure the penetration profile for the impurity diffusion in metals where suitable radioisotope as a tracer is unavailable or the half-life of radioisotope is very short.",
author = "Osamu Taguchi and Miyuki Hagiwara and Yoshihiro Yamazaki and Yoshiaki Iijima",
year = "2001",
month = "1",
day = "1",
language = "English",
pages = "91--96",
journal = "Defect and Diffusion Forum",
issn = "1012-0386",
publisher = "Trans Tech Publications",
number = "194-199 PART 1",

}

TY - JOUR

T1 - Impurity diffusion of Al and Cu in y-Fe

AU - Taguchi, Osamu

AU - Hagiwara, Miyuki

AU - Yamazaki, Yoshihiro

AU - Iijima, Yoshiaki

PY - 2001/1/1

Y1 - 2001/1/1

N2 - Impurity diffusion of Al and Cu in γ-Fe has been studied by using non-radioactive tracer elements. Penetration profiles have been determined by the lathe sectioning and the instrumental analyses, namely, absorptiometry for Al and atomic absorption analysis for Cu. Penetration curves obtained have been good for the diffusion analysis. The absorptiometry and atomic absorption analysis are found to be useful to measure the penetration profile for the impurity diffusion in metals where suitable radioisotope as a tracer is unavailable or the half-life of radioisotope is very short.

AB - Impurity diffusion of Al and Cu in γ-Fe has been studied by using non-radioactive tracer elements. Penetration profiles have been determined by the lathe sectioning and the instrumental analyses, namely, absorptiometry for Al and atomic absorption analysis for Cu. Penetration curves obtained have been good for the diffusion analysis. The absorptiometry and atomic absorption analysis are found to be useful to measure the penetration profile for the impurity diffusion in metals where suitable radioisotope as a tracer is unavailable or the half-life of radioisotope is very short.

UR - http://www.scopus.com/inward/record.url?scp=0035780622&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035780622&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0035780622

SP - 91

EP - 96

JO - Defect and Diffusion Forum

JF - Defect and Diffusion Forum

SN - 1012-0386

IS - 194-199 PART 1

ER -