Impurity diffusion of Al and Cu in y-Fe

Osamu Taguchi, Miyuki Hagiwara, Yoshihiro Yamazaki, Yoshiaki Iijima

研究成果: Contribution to journalArticle査読

11 被引用数 (Scopus)

抄録

Impurity diffusion of Al and Cu in γ-Fe has been studied by using non-radioactive tracer elements. Penetration profiles have been determined by the lathe sectioning and the instrumental analyses, namely, absorptiometry for Al and atomic absorption analysis for Cu. Penetration curves obtained have been good for the diffusion analysis. The absorptiometry and atomic absorption analysis are found to be useful to measure the penetration profile for the impurity diffusion in metals where suitable radioisotope as a tracer is unavailable or the half-life of radioisotope is very short.

本文言語英語
ページ(範囲)91-96
ページ数6
ジャーナルDefect and Diffusion Forum
194-199 PART 1
DOI
出版ステータス出版済み - 2001
外部発表はい

All Science Journal Classification (ASJC) codes

  • Radiation
  • Materials Science(all)
  • Condensed Matter Physics

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