In situ investigation of annealing effect on lamellar stacking structure of polyethylene thin films by synchrotron grazing-incidence small-angle and wide-angle X-ray scattering

Sono Sasaki, Hiroyasu Masunaga, Hiroo Tajiri, Katsuaki Inoue, Hiroshi Okuda, Hiromichi Noma, Kohji Honda, Atsushi Takahara, Masaki Takata

研究成果: Contribution to journalArticle査読

14 被引用数 (Scopus)

抄録

We have investigated lamellar stacking structure of melt-crystallized and annealed high-density polyethylene (HDPE) thin films, with a thickness of ca 400 nm prepared on silicon wafers, using synchrotron grazing-incidence small-angle and wide-angle X-ray scattering (GISWAXS) measurements at the BL40B2 beamline in SPring-8. In-situ measurements of GISWAXS were carried out for the films in a stepwise annealing process under vacuum. Scattering peaks relating to the long period, the average distance between stacked crystalline lamellae, were measured only in the in-plane direction near the Yoneda peak of the grazing-incidence small-angle X-ray scattering patterns. On the other hand, the orthorhombic (110) and (200) reflections of oriented HDPE crystals were measured in the out-of-plane direction of the grazing-incidence wide-angle X-ray scattering patterns. It was revealed that crystalline lamellae were stacked in a parallel direction to the film surface and the long period increased from ca 25 nm to ca 32 nm in a stepwise annealing process. Within a lamella, molecular chains were found to be packed regularly and the chain axis (the c axis) was relatively oriented parallel to the film surface.

本文言語英語
ページ(範囲)s642-s644
ジャーナルJournal of Applied Crystallography
40
SUPPL. 1
DOI
出版ステータス出版済み - 4 2007

All Science Journal Classification (ASJC) codes

  • 生化学、遺伝学、分子生物学(全般)

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