In situ measurement of capacitance: A method for fabricating nanoglass

Y. Ohta, M. Kitayama, K. Kaneko, S. Toh, F. Shimizu, K. Morinaga

    研究成果: Contribution to journalArticle査読

    24 被引用数 (Scopus)

    抄録

    The capacitance of the Na 2O-SiO 2 glass was measured in situ during heat treatment at various frequencies, 20, 100, 1, 3, 10, and 30 kHz. It was found that the capacitance of the glass abruptly decreases after a certain duration. The glass was quenched at this stage. It was confirmed by the X-ray diffraction and transmission electron microscopy that this decrease of capacitance was associated with the formation of crystallites in the glass matrix. The size of crystallites was observed to be in the range of about 10 nm.

    本文言語英語
    ページ(範囲)1634-1636
    ページ数3
    ジャーナルJournal of the American Ceramic Society
    88
    6
    DOI
    出版ステータス出版済み - 6 2005

    All Science Journal Classification (ASJC) codes

    • セラミックおよび複合材料
    • 材料化学

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