Influence of grain boundary scattering on the electrical properties of platinum nanofilms

Q. G. Zhang, X. Zhang, B. Y. Cao, M. Fujii, K. Takahashi, T. Ikuta

研究成果: ジャーナルへの寄稿学術誌査読

77 被引用数 (Scopus)

抄録

The electrical conductivity and temperature coefficient of resistance of polycrystalline platinum nanofilms have been investigated experimentally and theoretically. The results show that these electrical properties have been greatly reduced mainly by grain boundary scattering. By applying the theory of Mayadas and co-workers [Appl. Phys. Lett. 14, 345 (1969); Phys. Rev. B 1, 1382 (1970)] to predict the electrical conductivity and temperature coefficient of resistance with the same reflection coefficient, however, obvious discrepancies have been found. These discrepancies indicate that Drude's relation for bulk metals cannot be applied directly in the nanosized grain interior of polycrystalline metallic films.

本文言語英語
論文番号114102
ジャーナルApplied Physics Letters
89
11
DOI
出版ステータス出版済み - 2006

!!!All Science Journal Classification (ASJC) codes

  • 物理学および天文学(その他)

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