Influence of grain boundary scattering on the electrical properties of platinum nanofilms

Q. G. Zhang, X. Zhang, B. Y. Cao, M. Fujii, K. Takahashi, T. Ikuta

研究成果: Contribution to journalArticle

60 被引用数 (Scopus)

抄録

The electrical conductivity and temperature coefficient of resistance of polycrystalline platinum nanofilms have been investigated experimentally and theoretically. The results show that these electrical properties have been greatly reduced mainly by grain boundary scattering. By applying the theory of Mayadas and co-workers [Appl. Phys. Lett. 14, 345 (1969); Phys. Rev. B 1, 1382 (1970)] to predict the electrical conductivity and temperature coefficient of resistance with the same reflection coefficient, however, obvious discrepancies have been found. These discrepancies indicate that Drude's relation for bulk metals cannot be applied directly in the nanosized grain interior of polycrystalline metallic films.

元の言語英語
記事番号114102
ジャーナルApplied Physics Letters
89
発行部数11
DOI
出版物ステータス出版済み - 2006

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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