Influence of vacuum chamber impurities on the lifetime of organic light-emitting diodes

Hiroshi Fujimoto, Takashi Suekane, Katsuya Imanishi, Satoshi Yukiwaki, Hong Wei, Kaori Nagayoshi, Masayuki Yahiro, Chihaya Adachi

研究成果: ジャーナルへの寄稿記事

8 引用 (Scopus)

抄録

We evaluated the influence of impurities in the vacuum chamber used for the fabrication of organic light-emitting diodes on the lifetime of the fabricated devices and found a correlation between lifetime and the device fabrication time. The contact angle of the ITO substrates stored the chamber under vacuum were used to evaluate chamber cleanliness. Liquid chromatography-mass spectrometry was performed on Si wafers stored in the vacuum chamber before device fabrication to examine the impurities in the chamber. Surprisingly, despite the chamber and evaporation sources being at room temperature, a variety of materials were detected, including previously deposited materials and plasticizers from the vacuum chamber components. We show that the impurities, and not differences in water content, in the chamber were the source of lifetime variations even when the duration of exposure to impurities only varied before and after deposition of the emitter layer. These results suggest that the impurities floating in the vacuum chamber significantly impact lifetime values and reproducibility.

元の言語英語
記事番号38482
ジャーナルScientific reports
6
DOI
出版物ステータス出版済み - 12 13 2016

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vacuum chambers
light emitting diodes
chambers
life (durability)
impurities
fabrication
cleanliness
plasticizers
liquid chromatography
ITO (semiconductors)
floating
moisture content
emitters
mass spectroscopy
evaporation
wafers
vacuum
room temperature

All Science Journal Classification (ASJC) codes

  • General

これを引用

Influence of vacuum chamber impurities on the lifetime of organic light-emitting diodes. / Fujimoto, Hiroshi; Suekane, Takashi; Imanishi, Katsuya; Yukiwaki, Satoshi; Wei, Hong; Nagayoshi, Kaori; Yahiro, Masayuki; Adachi, Chihaya.

:: Scientific reports, 巻 6, 38482, 13.12.2016.

研究成果: ジャーナルへの寄稿記事

Fujimoto, H, Suekane, T, Imanishi, K, Yukiwaki, S, Wei, H, Nagayoshi, K, Yahiro, M & Adachi, C 2016, 'Influence of vacuum chamber impurities on the lifetime of organic light-emitting diodes', Scientific reports, 巻. 6, 38482. https://doi.org/10.1038/srep38482
Fujimoto H, Suekane T, Imanishi K, Yukiwaki S, Wei H, Nagayoshi K その他. Influence of vacuum chamber impurities on the lifetime of organic light-emitting diodes. Scientific reports. 2016 12 13;6. 38482. https://doi.org/10.1038/srep38482
Fujimoto, Hiroshi ; Suekane, Takashi ; Imanishi, Katsuya ; Yukiwaki, Satoshi ; Wei, Hong ; Nagayoshi, Kaori ; Yahiro, Masayuki ; Adachi, Chihaya. / Influence of vacuum chamber impurities on the lifetime of organic light-emitting diodes. :: Scientific reports. 2016 ; 巻 6.
@article{eb00018232de495bac1d9d92fe24703d,
title = "Influence of vacuum chamber impurities on the lifetime of organic light-emitting diodes",
abstract = "We evaluated the influence of impurities in the vacuum chamber used for the fabrication of organic light-emitting diodes on the lifetime of the fabricated devices and found a correlation between lifetime and the device fabrication time. The contact angle of the ITO substrates stored the chamber under vacuum were used to evaluate chamber cleanliness. Liquid chromatography-mass spectrometry was performed on Si wafers stored in the vacuum chamber before device fabrication to examine the impurities in the chamber. Surprisingly, despite the chamber and evaporation sources being at room temperature, a variety of materials were detected, including previously deposited materials and plasticizers from the vacuum chamber components. We show that the impurities, and not differences in water content, in the chamber were the source of lifetime variations even when the duration of exposure to impurities only varied before and after deposition of the emitter layer. These results suggest that the impurities floating in the vacuum chamber significantly impact lifetime values and reproducibility.",
author = "Hiroshi Fujimoto and Takashi Suekane and Katsuya Imanishi and Satoshi Yukiwaki and Hong Wei and Kaori Nagayoshi and Masayuki Yahiro and Chihaya Adachi",
year = "2016",
month = "12",
day = "13",
doi = "10.1038/srep38482",
language = "English",
volume = "6",
journal = "Scientific Reports",
issn = "2045-2322",
publisher = "Nature Publishing Group",

}

TY - JOUR

T1 - Influence of vacuum chamber impurities on the lifetime of organic light-emitting diodes

AU - Fujimoto, Hiroshi

AU - Suekane, Takashi

AU - Imanishi, Katsuya

AU - Yukiwaki, Satoshi

AU - Wei, Hong

AU - Nagayoshi, Kaori

AU - Yahiro, Masayuki

AU - Adachi, Chihaya

PY - 2016/12/13

Y1 - 2016/12/13

N2 - We evaluated the influence of impurities in the vacuum chamber used for the fabrication of organic light-emitting diodes on the lifetime of the fabricated devices and found a correlation between lifetime and the device fabrication time. The contact angle of the ITO substrates stored the chamber under vacuum were used to evaluate chamber cleanliness. Liquid chromatography-mass spectrometry was performed on Si wafers stored in the vacuum chamber before device fabrication to examine the impurities in the chamber. Surprisingly, despite the chamber and evaporation sources being at room temperature, a variety of materials were detected, including previously deposited materials and plasticizers from the vacuum chamber components. We show that the impurities, and not differences in water content, in the chamber were the source of lifetime variations even when the duration of exposure to impurities only varied before and after deposition of the emitter layer. These results suggest that the impurities floating in the vacuum chamber significantly impact lifetime values and reproducibility.

AB - We evaluated the influence of impurities in the vacuum chamber used for the fabrication of organic light-emitting diodes on the lifetime of the fabricated devices and found a correlation between lifetime and the device fabrication time. The contact angle of the ITO substrates stored the chamber under vacuum were used to evaluate chamber cleanliness. Liquid chromatography-mass spectrometry was performed on Si wafers stored in the vacuum chamber before device fabrication to examine the impurities in the chamber. Surprisingly, despite the chamber and evaporation sources being at room temperature, a variety of materials were detected, including previously deposited materials and plasticizers from the vacuum chamber components. We show that the impurities, and not differences in water content, in the chamber were the source of lifetime variations even when the duration of exposure to impurities only varied before and after deposition of the emitter layer. These results suggest that the impurities floating in the vacuum chamber significantly impact lifetime values and reproducibility.

UR - http://www.scopus.com/inward/record.url?scp=85006049211&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85006049211&partnerID=8YFLogxK

U2 - 10.1038/srep38482

DO - 10.1038/srep38482

M3 - Article

AN - SCOPUS:85006049211

VL - 6

JO - Scientific Reports

JF - Scientific Reports

SN - 2045-2322

M1 - 38482

ER -