Investigation of molecular and lamellar aggregation structure of crystalline polymer thin films by synchrotron GIXD and GISAXS measurements

Sono Sasaki, Hiroyasu Masunaga, Katsuaki Inoue, Osami Sakata, Hiroo Tajiri, Hiroshi Okuda, Hiromichi Noma, Kouji Honda, Atsushi Takahara, Masaki Takata

研究成果: 著書/レポートタイプへの貢献会議での発言

抄録

In this stuay, molecular and meso-scale structures sucn as molecular/Tamellar orientation ana lamellar stacking distance were investigated for HDPE thin films by synchrotron 2D-grazing-incidence wide-angle X-ray diffraction/small-angle X-ray scattering (SR-2D-GIXD/GISAXS) simultaneous measurements. A sample used in this study was additive free high-density polyethylene (HDPE). HDPE films with a thickness of ca. 400 nm were prepared onto Si wafers by a dip-coating method. The obtained films on the wafers were isothermally crystallized at a crystallization temperature of 373K from the melt. Afterward, some of the obtained films were treated at an annealing temperature (Ta) of 378K, 383K or 388K for 24 hours or annealed at each Ta in a stepwise heating from ca. 300K. In-situ and ex-situ measurements of 2D-GIXD/GISAXS for melt-crystallized and annealed films were carried out with imaging-plates at the BL40B2 beamline of SPring-8. The wavelength of incident X-rays was 0.15 nm and camera length was ca. 110 mm for GIXD and ca. 2180 mm for GISAXS. On the basis of 2D-GIXD patterns for HDPE thin films during a stepwise annealing, it was implied that the a axis of orthorhombic unit cell relatively oriented in the out-of-plane direction. Strong scatterings near Yoneda peak in the in-plane direction of 2D-GISAXSpatterns were detected for the films. The peak position of the scattering corresponds to the long period, the average distance between stacked crystalline lamellae. By annealing the film, the peak position of the scattering shifted to the lower qy range in the in-plane direction. These results indicated that crystalline lamellae were stacked in the parallel direction to the film surface and the long period became longer from ca. 25 nm to ca. 35 nm by annealing. In a lamella, chains were regularly packed and the chain axis (the c axis) was relatively oriented parallel to the film surface.

元の言語英語
ホスト出版物のタイトル55th SPSJ Symposium on Macromolecules
ページ4314-4315
ページ数2
55
エディション2
出版物ステータス出版済み - 2006
イベント55th Society of Polymer Science Japan Symposium on Macromolecules - Toyama, 日本
継続期間: 9 20 20069 22 2006

その他

その他55th Society of Polymer Science Japan Symposium on Macromolecules
日本
Toyama
期間9/20/069/22/06

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Synchrotrons
Polymer films
Agglomeration
Crystalline materials
Thin films
High density polyethylenes
Annealing
Scattering
Molecular orientation
X ray scattering
Temperature
Crystallization
Cameras
Imaging techniques
Heating
X ray diffraction
X rays
Coatings
Wavelength

All Science Journal Classification (ASJC) codes

  • Engineering(all)

これを引用

Sasaki, S., Masunaga, H., Inoue, K., Sakata, O., Tajiri, H., Okuda, H., ... Takata, M. (2006). Investigation of molecular and lamellar aggregation structure of crystalline polymer thin films by synchrotron GIXD and GISAXS measurements. : 55th SPSJ Symposium on Macromolecules (2 版, 巻 55, pp. 4314-4315)

Investigation of molecular and lamellar aggregation structure of crystalline polymer thin films by synchrotron GIXD and GISAXS measurements. / Sasaki, Sono; Masunaga, Hiroyasu; Inoue, Katsuaki; Sakata, Osami; Tajiri, Hiroo; Okuda, Hiroshi; Noma, Hiromichi; Honda, Kouji; Takahara, Atsushi; Takata, Masaki.

55th SPSJ Symposium on Macromolecules. 巻 55 2. 編 2006. p. 4314-4315.

研究成果: 著書/レポートタイプへの貢献会議での発言

Sasaki, S, Masunaga, H, Inoue, K, Sakata, O, Tajiri, H, Okuda, H, Noma, H, Honda, K, Takahara, A & Takata, M 2006, Investigation of molecular and lamellar aggregation structure of crystalline polymer thin films by synchrotron GIXD and GISAXS measurements. : 55th SPSJ Symposium on Macromolecules. 2 Edn, 巻. 55, pp. 4314-4315, 55th Society of Polymer Science Japan Symposium on Macromolecules, Toyama, 日本, 9/20/06.
Sasaki S, Masunaga H, Inoue K, Sakata O, Tajiri H, Okuda H その他. Investigation of molecular and lamellar aggregation structure of crystalline polymer thin films by synchrotron GIXD and GISAXS measurements. : 55th SPSJ Symposium on Macromolecules. 2 版 巻 55. 2006. p. 4314-4315
Sasaki, Sono ; Masunaga, Hiroyasu ; Inoue, Katsuaki ; Sakata, Osami ; Tajiri, Hiroo ; Okuda, Hiroshi ; Noma, Hiromichi ; Honda, Kouji ; Takahara, Atsushi ; Takata, Masaki. / Investigation of molecular and lamellar aggregation structure of crystalline polymer thin films by synchrotron GIXD and GISAXS measurements. 55th SPSJ Symposium on Macromolecules. 巻 55 2. 版 2006. pp. 4314-4315
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abstract = "In this stuay, molecular and meso-scale structures sucn as molecular/Tamellar orientation ana lamellar stacking distance were investigated for HDPE thin films by synchrotron 2D-grazing-incidence wide-angle X-ray diffraction/small-angle X-ray scattering (SR-2D-GIXD/GISAXS) simultaneous measurements. A sample used in this study was additive free high-density polyethylene (HDPE). HDPE films with a thickness of ca. 400 nm were prepared onto Si wafers by a dip-coating method. The obtained films on the wafers were isothermally crystallized at a crystallization temperature of 373K from the melt. Afterward, some of the obtained films were treated at an annealing temperature (Ta) of 378K, 383K or 388K for 24 hours or annealed at each Ta in a stepwise heating from ca. 300K. In-situ and ex-situ measurements of 2D-GIXD/GISAXS for melt-crystallized and annealed films were carried out with imaging-plates at the BL40B2 beamline of SPring-8. The wavelength of incident X-rays was 0.15 nm and camera length was ca. 110 mm for GIXD and ca. 2180 mm for GISAXS. On the basis of 2D-GIXD patterns for HDPE thin films during a stepwise annealing, it was implied that the a axis of orthorhombic unit cell relatively oriented in the out-of-plane direction. Strong scatterings near Yoneda peak in the in-plane direction of 2D-GISAXSpatterns were detected for the films. The peak position of the scattering corresponds to the long period, the average distance between stacked crystalline lamellae. By annealing the film, the peak position of the scattering shifted to the lower qy range in the in-plane direction. These results indicated that crystalline lamellae were stacked in the parallel direction to the film surface and the long period became longer from ca. 25 nm to ca. 35 nm by annealing. In a lamella, chains were regularly packed and the chain axis (the c axis) was relatively oriented parallel to the film surface.",
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AU - Sasaki, Sono

AU - Masunaga, Hiroyasu

AU - Inoue, Katsuaki

AU - Sakata, Osami

AU - Tajiri, Hiroo

AU - Okuda, Hiroshi

AU - Noma, Hiromichi

AU - Honda, Kouji

AU - Takahara, Atsushi

AU - Takata, Masaki

PY - 2006

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