Phase transition behavior of docosyltrichlorosilane (DOTS) and octadecyltrichlorosilane (OTS) monolayers prepared on Si-wafer surface was investigated based on in plane grazing incidence X-ray diffraction (in plane GIXD) at various temperatures. The DOTS and OTS monolayer was prepared by a water-cast method (DOTS-W) and chemisorption method (OTS-S), respectively. The temperature dependent in plane GIXD measurements clarified that crystalline state of DOTS-W monolayer changes from rectangular phase to hexagonal one with an increase in temperature. An estimated linear thermal expansion coefficient of rectangular DOTS-W monolayer assigned a similar value of bulk polyethylene. The OTS-S monolayer also changed from hexagonal lattice to amorphous state above a melting point of octadecyl groups.
|ホスト出版物のタイトル||54th SPSJ Annual Meeting 2005 - Polymer Preprints, Japan|
|出版ステータス||出版済み - 12 1 2005|
|イベント||54th SPSJ Annual Meeting 2005 - Yokohama, 日本|
継続期間: 5 25 2005 → 5 27 2005
|その他||54th SPSJ Annual Meeting 2005|
|Period||5/25/05 → 5/27/05|
All Science Journal Classification (ASJC) codes