In this paper, we have investigate that the degradation mechanism of OLEDs using Alq3 and FIrpic as emitting materials. For the Alq3 device, ultra-thin layers of MoO3 significantly enhance the device durability. The optimized MoO3 thickness was 0.75 nm, realizing the lowest voltage and the longest lifetime. We found that the device stabilities strongly depend on the process pressure during the device fabrication. In both fluorescent and phosphorescent emitting materials, the devices fabricated under UHV conditions demonstrated excellent long-term stabilities.
|ジャーナル||Digest of Technical Papers - SID International Symposium|
|出版物ステータス||出版済み - 1 1 2009|
|イベント||2009 Vehicles and Photons Symposium - Dearborn, MI, 米国|
継続期間: 10 15 2009 → 10 16 2009
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