The lattice damage kinetics of defect accumulation in ion irradiated yttria-stabilized cubic zirconia (YSZ) was investigated by using in situ Rutherford backscattering spectrometry and channeling (RBS/C) techniques. The samples of single crystalline YSZ were irradiated with 400 keV Xe++ ions over a range of doses and for sample temperatures of 170 and 300 K. Under all irradiation conditions studied, the samples remained crystalline. However, lattice damage, as measured by the minimum yield, χmin, was observed to have three distinct stages (stages I-III) in the rate of accumulation. Energy dependent channeling experiments revealed -1 and 1/2 power dependence for the dechanneling parameter in stage I and stage III, respectively. Corresponding transmission electron microscopy (TEM) studies detected defects which appear as tiny dot contrasts in stage I samples, ultimately leading to the overlaps of dislocations at stage III. The three stages of damage accumulations have been interpreted as an evolving defect structure which changes the dominant RBS/C ion scattering process from direct scattering to dechanneling. A comparison between RBS/C and TEM techniques has also been made for the effective use of in situ RBS/C techniques for the study of radiation damage.
|ジャーナル||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms|
|出版ステータス||出版済み - 3 1998|
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