TY - JOUR
T1 - Low-energy electron diffraction patterns using field-emitted electrons from tungsten tips
AU - Mizuno, Seigi
AU - Rahman, F.
AU - Iwanaga, Masayuki
PY - 2006/2/3
Y1 - 2006/2/3
N2 - We have observed low-energy electron diffraction patterns of Cu(001) clean surface using field-emitted electrons from tungsten tips. Only elastically scattered electrons contribute to diffraction patterns. Tip-sample distance, bias voltage, electron beam opening angle and tip apex structure determine the probing diameter and symmetry of diffraction patterns. The emission current, bias voltage and estimated probing diameter for the observed diffraction patterns were 0.15nA, 75-82V, and 4-40 μm, respectively.
AB - We have observed low-energy electron diffraction patterns of Cu(001) clean surface using field-emitted electrons from tungsten tips. Only elastically scattered electrons contribute to diffraction patterns. Tip-sample distance, bias voltage, electron beam opening angle and tip apex structure determine the probing diameter and symmetry of diffraction patterns. The emission current, bias voltage and estimated probing diameter for the observed diffraction patterns were 0.15nA, 75-82V, and 4-40 μm, respectively.
UR - http://www.scopus.com/inward/record.url?scp=32044436076&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=32044436076&partnerID=8YFLogxK
U2 - 10.1143/JJAP.45.L178
DO - 10.1143/JJAP.45.L178
M3 - Article
AN - SCOPUS:32044436076
SN - 0021-4922
VL - 45
SP - L178-L179
JO - Japanese Journal of Applied Physics, Part 2: Letters
JF - Japanese Journal of Applied Physics, Part 2: Letters
IS - 4-7
ER -