Low temperature defect chemistry of oxide electroceramics

K. Sasaki, J. Maier

研究成果: ジャーナルへの寄稿学術誌査読

抄録

Defect chemistry of oxides at lower temperatures, e.g. room temperature, especially for electronics applications is analyzed, at which the oxygen exchange equilibrium reaction is no longer reversible but the internal ionization equilibrium reactions, in particular electronic transfer processes, are still reversible. Defect concentrations at such a temperature can be derived numerically as well as analytically. It is pointed out that the low temperature defect chemistry offers a quantitative basis to manipulate charge carrier and defect concentrations and related physical properties of oxide electroceramics.

本文言語英語
ページ(範囲)189-192
ページ数4
ジャーナルKey Engineering Materials
169
出版ステータス出版済み - 1月 1 1999
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 材料科学(全般)
  • 材料力学
  • 機械工学

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