抄録
We have investigated phosphorus (P) doping into Ge(001) surfaces by using ultraviolet laser irradiation in phosphoric acid solution at room temperature. We demonstrated that the diffusion depth of P in Ge and the concentration of electrically activated P can be controlled by the number of laser shots. Indeed, a high concentration of electrically activated P of 2.4 × 1019 cm-3 was realized by 1000-times laser shots at a laser energy of 1.0 J/cm2, which is comparable or better than the counterparts of conventional n-type doping using a high thermal budget over 600 °C. The generation current is dominant in the reverse bias condition for the laser-doped pn-junction diodes independent on the number of laser shots, thus indicating low-damage during the pn-junction formation. These results open up the possibility for applicable low thermal budget doping process for Ge-based devices fabricated on flexible substrates as well as Si electronics.
本文言語 | 英語 |
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論文番号 | 052104 |
ジャーナル | Applied Physics Letters |
巻 | 108 |
号 | 5 |
DOI | |
出版ステータス | 出版済み - 2月 1 2016 |
!!!All Science Journal Classification (ASJC) codes
- 物理学および天文学(その他)