Magnetic impurity effect in atomic sized conductor

Koichiro Ienaga, Naoya Nakashima, Yuji Inagaki, Tatsuya Kawae, Hiroyuki Tsujii

研究成果: 著書/レポートタイプへの貢献会議での発言

抜粋

We have studied the electrical conductance in Au nanowire containing 0.07 at.% Fe ions and Cu nanowire containing 13 at.% Mn ions with mechanically controllable break junction technique to investigate the magnetic impurity effects in the atomic-sized conductance. We observe not only conductance steps at the integer multiples of G0 = 2e2/h, but also steps deviating from them. The scattering between the conduction electrons and impurity ions lifts the spin degeneracy of the transmission probability, which may be responsible for the deviation.

元の言語英語
ホスト出版物のタイトルTENCON 2010 - 2010 IEEE Region 10 Conference
ページ1885-1887
ページ数3
DOI
出版物ステータス出版済み - 2010
イベント2010 IEEE Region 10 Conference, TENCON 2010 - Fukuoka, 日本
継続期間: 11 21 201011 24 2010

その他

その他2010 IEEE Region 10 Conference, TENCON 2010
日本
Fukuoka
期間11/21/1011/24/10

    フィンガープリント

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Computer Science Applications

これを引用

Ienaga, K., Nakashima, N., Inagaki, Y., Kawae, T., & Tsujii, H. (2010). Magnetic impurity effect in atomic sized conductor. : TENCON 2010 - 2010 IEEE Region 10 Conference (pp. 1885-1887). [5686395] https://doi.org/10.1109/TENCON.2010.5686395