Magnetic Microscopy for Nondestructive Characterization of Local Critical Current Distribution in MgB2 Wires With Magnetic Sheath Materials

Kohei Higashikawa, Hiroshi Tatara, Masayoshi Inoue, Shujun Ye, Akiyoshi Matsumoto, Hiroaki Kumakura, Takanobu Kiss

研究成果: ジャーナルへの寄稿記事

1 引用 (Scopus)

抄録

We have developed a method for the nondestructive characterization of critical current distribution in MgB2 wires based on magnetic microscopy. This method enables us to evaluate critical currents of MgB2 wires, even in the condition where they become too large to be measured by the conventional four-probe transport method from the viewpoint of heat generation and/or the limitation from the measurement system. Furthermore, the inhomogeneity in local critical currents in the wires can be also estimated, while it is difficult for the conventional magnetization method, using a SQUID magnetometer. In this paper, by overcoming the influence of magnetic sheath materials, which are widely used for recent high-performance MgB2 wires, we have succeeded in developing a nondestructive method for the characterization of longitudinal distribution of local critical currents in them. This method will become a fundamental technique for a nondestructive product testing at the stage of full-fledged commercial production in the future.

元の言語英語
記事番号7378317
ジャーナルIEEE Transactions on Applied Superconductivity
26
発行部数3
DOI
出版物ステータス出版済み - 4 1 2016

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Critical currents
current distribution
sheaths
critical current
Microscopic examination
wire
Wire
microscopy
heat generation
SQUIDs
Heat generation
Magnetometers
magnetometers
Magnetization
inhomogeneity
magnetization
probes
Testing
products

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

これを引用

Magnetic Microscopy for Nondestructive Characterization of Local Critical Current Distribution in MgB2 Wires With Magnetic Sheath Materials. / Higashikawa, Kohei; Tatara, Hiroshi; Inoue, Masayoshi; Ye, Shujun; Matsumoto, Akiyoshi; Kumakura, Hiroaki; Kiss, Takanobu.

:: IEEE Transactions on Applied Superconductivity, 巻 26, 番号 3, 7378317, 01.04.2016.

研究成果: ジャーナルへの寄稿記事

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AU - Ye, Shujun

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AU - Kumakura, Hiroaki

AU - Kiss, Takanobu

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