Malfunction suppression of semiconductor circuit breaker in high voltage DC power supply system

Seiya Abe, Sihun Yang, Mariko Ogawa, Masahito Shoyama, Tamotsu Ninomiya, Akira Matsumoto, Akiyoshi Fukui, Mikio Yamasaki

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

抄録

In high voltage DC power supply system (HVDC) system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction occurs, unexpected large current is flown to the other normal line. In this paper, the malfunction suppression of semiconductor circuit breaker is described. It demonstrated by using MATLAB/Simulink Moreover, the demonstrated results are confirmed by experimentally.

本文言語英語
ホスト出版物のタイトルTENCON 2010 - 2010 IEEE Region 10 Conference
ページ1278-1283
ページ数6
DOI
出版ステータス出版済み - 12 1 2010
イベント2010 IEEE Region 10 Conference, TENCON 2010 - Fukuoka, 日本
継続期間: 11 21 201011 24 2010

出版物シリーズ

名前IEEE Region 10 Annual International Conference, Proceedings/TENCON

その他

その他2010 IEEE Region 10 Conference, TENCON 2010
Country日本
CityFukuoka
Period11/21/1011/24/10

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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