A new technique to measure the first and second derivatives of the ion temperature profile has been developed by using a charge exchange spectroscopy system with space modulation optics. The space observed is scanned up to ±3 cm with a cosine wave modulation frequency up to 30 Hz by shifting the object lens in front of the optical fiber bundle by 0.5 mm with a piezoelement. The first and second derivatives of ion temperature are derived from the modulation component of the ion temperature measured by using Fourier series expansion.
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