Measurement of electron energy distribution obtained from wedge type silicon emitter array

Katsuya Higa; Akiyoshi Baba; Tanemasa Asano

doi:10.1109/imnc.2004.245640

Measurement of electron energy distribution obtained from wedge type silicon emitter array

Katsuya Higa, Akiyoshi Baba, Tanemasa Asano

日本エジプト科学技術連携センター

研究成果: 書籍/レポートタイプへの寄稿 › 会議への寄与

本文言語	英語
ホスト出版物のタイトル	Digest of Papers - Microprocesses and Nanotechnology 2004
出版社	The Japan Society of Applied Physics
ページ	258-259
ページ数	2
ISBN（印刷版）	4990247205, 9784990247201
DOI	https://doi.org/10.1109/imnc.2004.245640
出版ステータス	出版済み - 2004
イベント	2004 International Microprocesses and Nanotechnology Conference - Osaka, 日本継続期間: 10月 26 2004 → 10月 29 2004

出版物シリーズ

名前	Digest of Papers - Microprocesses and Nanotechnology 2004

その他

その他	2004 International Microprocesses and Nanotechnology Conference
国/地域	日本
City	Osaka
Period	10/26/04 → 10/29/04

!!!All Science Journal Classification (ASJC) codes

工学（全般）

文献へのアクセス

10.1109/imnc.2004.245640

他のファイルとリンク

引用スタイル

Measurement of electron energy distribution obtained from wedge type silicon emitter array. / Higa, Katsuya; Baba, Akiyoshi; Asano, Tanemasa.

Digest of Papers - Microprocesses and Nanotechnology 2004. The Japan Society of Applied Physics, 2004. p. 258-259 28P-7-11 (Digest of Papers - Microprocesses and Nanotechnology 2004).

研究成果: 書籍/レポートタイプへの寄稿 › 会議への寄与

Higa, K, Baba, A & Asano, T 2004, Measurement of electron energy distribution obtained from wedge type silicon emitter array. in Digest of Papers - Microprocesses and Nanotechnology 2004., 28P-7-11, Digest of Papers - Microprocesses and Nanotechnology 2004, The Japan Society of Applied Physics, pp. 258-259, 2004 International Microprocesses and Nanotechnology Conference, Osaka, 日本, 10/26/04. https://doi.org/10.1109/imnc.2004.245640

@inproceedings{a1458dba388c4c598dcc48833d29417f,

title = "Measurement of electron energy distribution obtained from wedge type silicon emitter array",

author = "Katsuya Higa and Akiyoshi Baba and Tanemasa Asano",

year = "2004",

doi = "10.1109/imnc.2004.245640",

language = "English",

isbn = "4990247205",

series = "Digest of Papers - Microprocesses and Nanotechnology 2004",

publisher = "The Japan Society of Applied Physics",

pages = "258--259",

booktitle = "Digest of Papers - Microprocesses and Nanotechnology 2004",

note = "2004 International Microprocesses and Nanotechnology Conference ; Conference date: 26-10-2004 Through 29-10-2004",

}

TY - GEN

T1 - Measurement of electron energy distribution obtained from wedge type silicon emitter array

AU - Higa, Katsuya

AU - Baba, Akiyoshi

AU - Asano, Tanemasa

PY - 2004

Y1 - 2004

UR - http://www.scopus.com/inward/record.url?scp=23244456513&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=23244456513&partnerID=8YFLogxK

U2 - 10.1109/imnc.2004.245640

DO - 10.1109/imnc.2004.245640

M3 - Conference contribution

AN - SCOPUS:23244456513

SN - 4990247205

SN - 9784990247201

T3 - Digest of Papers - Microprocesses and Nanotechnology 2004

SP - 258

EP - 259

BT - Digest of Papers - Microprocesses and Nanotechnology 2004

PB - The Japan Society of Applied Physics

T2 - 2004 International Microprocesses and Nanotechnology Conference

Y2 - 26 October 2004 through 29 October 2004

ER -