Measurement of in-plane magnetic relaxation in RE-123 coated conductors by use of scanning Hall probe microscopy

K. Shiohara, K. Higashikawa, M. Inoue, T. Kiss, Y. Iijima, T. Saitoh, M. Yoshizumi, T. Izumi

研究成果: ジャーナルへの寄稿学術誌査読

13 被引用数 (Scopus)

抄録

We have investigated electric field criterion of in-plane critical current density in a coated conductor characterized by scanning Hall-probe microscopy (SHPM). From remanent field distribution and its relaxation measurements, we could obtain critical current distribution and induced electric field simultaneously by considering the Biot-Savart law and the Faraday's law, respectively. These results lead us to evaluate a distribution of local critical current density and the corresponding criterion of electric field. As a result, it was found that the electric field criterion for the SHPM analysis was several orders lower than that used in the conventional 4-probe resistive method. However, the data point obtained by the SHPM shows good agreement with E-J curve analytically extended from the measurements by the 4-probe method. This means that we could characterize in-plane distribution of critical current density in a coated conductor at an electric field criterion quantitatively by this method in a nondestructive manner. These findings will be very important information since the uniformity of local critical current density in a coated conductor at extremely low electric fields is a key issue (1) especially for DC applications, (2) for quality control of coated conductors, and (3) for the standardization of the characterization of critical current among different methods.

本文言語英語
ページ(範囲)139-141
ページ数3
ジャーナルPhysica C: Superconductivity and its applications
484
DOI
出版ステータス出版済み - 1月 15 2013

!!!All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • エネルギー工学および電力技術
  • 電子工学および電気工学

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