Measurement of in-plane magnetic relaxation in RE-123 coated conductors by use of scanning Hall probe microscopy

K. Shiohara, Kohei Higashikawa, Masayoshi Inoue, Takanobu Kiss, Y. Iijima, T. Saitoh, M. Yoshizumi, T. Izumi

研究成果: ジャーナルへの寄稿記事

9 引用 (Scopus)

抄録

We have investigated electric field criterion of in-plane critical current density in a coated conductor characterized by scanning Hall-probe microscopy (SHPM). From remanent field distribution and its relaxation measurements, we could obtain critical current distribution and induced electric field simultaneously by considering the Biot-Savart law and the Faraday's law, respectively. These results lead us to evaluate a distribution of local critical current density and the corresponding criterion of electric field. As a result, it was found that the electric field criterion for the SHPM analysis was several orders lower than that used in the conventional 4-probe resistive method. However, the data point obtained by the SHPM shows good agreement with E-J curve analytically extended from the measurements by the 4-probe method. This means that we could characterize in-plane distribution of critical current density in a coated conductor at an electric field criterion quantitatively by this method in a nondestructive manner. These findings will be very important information since the uniformity of local critical current density in a coated conductor at extremely low electric fields is a key issue (1) especially for DC applications, (2) for quality control of coated conductors, and (3) for the standardization of the characterization of critical current among different methods.

元の言語英語
ページ(範囲)139-141
ページ数3
ジャーナルPhysica C: Superconductivity and its applications
484
DOI
出版物ステータス出版済み - 1 15 2013

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Magnetic relaxation
magnetic relaxation
critical current
Microscopic examination
conductors
Electric fields
microscopy
Scanning
scanning
electric fields
probes
current density
Critical currents
Biot-Savart law
standardization
current distribution
quality control
Standardization
Quality control
direct current

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

これを引用

Measurement of in-plane magnetic relaxation in RE-123 coated conductors by use of scanning Hall probe microscopy. / Shiohara, K.; Higashikawa, Kohei; Inoue, Masayoshi; Kiss, Takanobu; Iijima, Y.; Saitoh, T.; Yoshizumi, M.; Izumi, T.

:: Physica C: Superconductivity and its applications, 巻 484, 15.01.2013, p. 139-141.

研究成果: ジャーナルへの寄稿記事

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abstract = "We have investigated electric field criterion of in-plane critical current density in a coated conductor characterized by scanning Hall-probe microscopy (SHPM). From remanent field distribution and its relaxation measurements, we could obtain critical current distribution and induced electric field simultaneously by considering the Biot-Savart law and the Faraday's law, respectively. These results lead us to evaluate a distribution of local critical current density and the corresponding criterion of electric field. As a result, it was found that the electric field criterion for the SHPM analysis was several orders lower than that used in the conventional 4-probe resistive method. However, the data point obtained by the SHPM shows good agreement with E-J curve analytically extended from the measurements by the 4-probe method. This means that we could characterize in-plane distribution of critical current density in a coated conductor at an electric field criterion quantitatively by this method in a nondestructive manner. These findings will be very important information since the uniformity of local critical current density in a coated conductor at extremely low electric fields is a key issue (1) especially for DC applications, (2) for quality control of coated conductors, and (3) for the standardization of the characterization of critical current among different methods.",
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AU - Shiohara, K.

AU - Higashikawa, Kohei

AU - Inoue, Masayoshi

AU - Kiss, Takanobu

AU - Iijima, Y.

AU - Saitoh, T.

AU - Yoshizumi, M.

AU - Izumi, T.

PY - 2013/1/15

Y1 - 2013/1/15

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