抄録
We have carried out 2-dimensional (2D) measurement of local critical current in a Trifluoroacetates-Metal Organic Deposition (TFA-MOD) processed YBCO coated conductor using scanning Hall-probe microscopy. Recently, remarkable R&D accomplishments on the fabrication processes of coated conductors have been conducted extensively and reported. The TFA-MOD process has been expected as an attractive process to produce coated conductors with high performance at a low production cost due to a simple process using non-vacuum equipments. On the other hand, enhancement of critical currents and homogenization of the critical current distribution in the coated conductors are definitely very important for practical applications. According to our measurements, we can detect positions and spatial distribution of defects in the conductor. This kind of information will be very helpful for the improvement of the TFA-MOD process and for the design of the conductor intended for practical electric power device applications.
| 元の言語 | 英語 |
|---|---|
| ページ（範囲） | 1041-1044 |
| ページ数 | 4 |
| ジャーナル | Physica C: Superconductivity and its applications |
| 巻 | 471 |
| 発行部数 | 21-22 |
| DOI | |
| 出版物ステータス | 出版済み - 11 1 2011 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
これを引用
Measurement of local critical currents in TFA-MOD processed coated conductors by use of scanning Hall-probe microscopy. / Shiohara, K.; Higashikawa, Kohei; Kawaguchi, T.; Inoue, Masayoshi; Kiss, Takanobu; Yoshizumi, M.; Izumi, T.
：: Physica C: Superconductivity and its applications, 巻 471, 番号 21-22, 01.11.2011, p. 1041-1044.研究成果: ジャーナルへの寄稿 › 記事
}
TY - JOUR
T1 - Measurement of local critical currents in TFA-MOD processed coated conductors by use of scanning Hall-probe microscopy
AU - Shiohara, K.
AU - Higashikawa, Kohei
AU - Kawaguchi, T.
AU - Inoue, Masayoshi
AU - Kiss, Takanobu
AU - Yoshizumi, M.
AU - Izumi, T.
PY - 2011/11/1
Y1 - 2011/11/1
N2 - We have carried out 2-dimensional (2D) measurement of local critical current in a Trifluoroacetates-Metal Organic Deposition (TFA-MOD) processed YBCO coated conductor using scanning Hall-probe microscopy. Recently, remarkable R&D accomplishments on the fabrication processes of coated conductors have been conducted extensively and reported. The TFA-MOD process has been expected as an attractive process to produce coated conductors with high performance at a low production cost due to a simple process using non-vacuum equipments. On the other hand, enhancement of critical currents and homogenization of the critical current distribution in the coated conductors are definitely very important for practical applications. According to our measurements, we can detect positions and spatial distribution of defects in the conductor. This kind of information will be very helpful for the improvement of the TFA-MOD process and for the design of the conductor intended for practical electric power device applications.
AB - We have carried out 2-dimensional (2D) measurement of local critical current in a Trifluoroacetates-Metal Organic Deposition (TFA-MOD) processed YBCO coated conductor using scanning Hall-probe microscopy. Recently, remarkable R&D accomplishments on the fabrication processes of coated conductors have been conducted extensively and reported. The TFA-MOD process has been expected as an attractive process to produce coated conductors with high performance at a low production cost due to a simple process using non-vacuum equipments. On the other hand, enhancement of critical currents and homogenization of the critical current distribution in the coated conductors are definitely very important for practical applications. According to our measurements, we can detect positions and spatial distribution of defects in the conductor. This kind of information will be very helpful for the improvement of the TFA-MOD process and for the design of the conductor intended for practical electric power device applications.
UR - http://www.scopus.com/inward/record.url?scp=80054998820&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=80054998820&partnerID=8YFLogxK
U2 - 10.1016/j.physc.2011.05.119
DO - 10.1016/j.physc.2011.05.119
M3 - Article
AN - SCOPUS:80054998820
VL - 471
SP - 1041
EP - 1044
JO - Physica C: Superconductivity and its Applications
JF - Physica C: Superconductivity and its Applications
SN - 0921-4534
IS - 21-22
ER -