Measurement of local critical currents in TFA-MOD processed coated conductors by use of scanning Hall-probe microscopy

K. Shiohara, K. Higashikawa, T. Kawaguchi, M. Inoue, T. Kiss, M. Yoshizumi, T. Izumi

研究成果: ジャーナルへの寄稿学術誌査読

2 被引用数 (Scopus)

抄録

We have carried out 2-dimensional (2D) measurement of local critical current in a Trifluoroacetates-Metal Organic Deposition (TFA-MOD) processed YBCO coated conductor using scanning Hall-probe microscopy. Recently, remarkable R&D accomplishments on the fabrication processes of coated conductors have been conducted extensively and reported. The TFA-MOD process has been expected as an attractive process to produce coated conductors with high performance at a low production cost due to a simple process using non-vacuum equipments. On the other hand, enhancement of critical currents and homogenization of the critical current distribution in the coated conductors are definitely very important for practical applications. According to our measurements, we can detect positions and spatial distribution of defects in the conductor. This kind of information will be very helpful for the improvement of the TFA-MOD process and for the design of the conductor intended for practical electric power device applications.

本文言語英語
ページ(範囲)1041-1044
ページ数4
ジャーナルPhysica C: Superconductivity and its applications
471
21-22
DOI
出版ステータス出版済み - 11月 2011

!!!All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • エネルギー工学および電力技術
  • 電子工学および電気工学

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