Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities

R. Holmestad, A. L. Weickenmeier, J. M. Zuo, J. C H Spence, Zenji Horita

研究成果: ジャーナルへの寄稿学術誌査読

1 被引用数 (Scopus)

抄録

A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.

本文言語英語
ページ(範囲)698-699
ページ数2
ジャーナルUnknown Journal
出版ステータス出版済み - 1993
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 工学(全般)

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