Microscopically smooth surface of pulse laser deposited yba2cu3o7 film shown by grazing incidence x-ray reflectivity

Harumi Asami, Yukio Watanabe

研究成果: Contribution to journalArticle査読

6 被引用数 (Scopus)

抄録

Surface and film/substrate interface roughness of YBa2Cu3O7 films deposited on MgO(100) and SrTiO3(100) by rapid sequential pulse laser deposition has been determined from X-ray reflectivity data. The film on MgO had the average roughness of 26.2 Å at the film/substrate interface and roughness of one unit cell order at the surface. On the other hand, the film on SrTiO3 had approximately the average roughness of 40 Å at both the surface and film/substrate interface. Obviously, the surface of the film on MgO is smoother than that on STO. The rough surface of the film on SrTiO3 is considered to be partly due to the growth of the film along the steps of the substrate, while the film on MgO grows without the influence of the steps on the substrate.

本文言語英語
ページ(範囲)L1073-L1076
ジャーナルJapanese Journal of Applied Physics
33
8
DOI
出版ステータス出版済み - 8 1994
外部発表はい

All Science Journal Classification (ASJC) codes

  • 工学(全般)
  • 物理学および天文学(全般)

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