Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa2Cu3O7 and Bi2Sr2CuO6+y

Yukio Watanabe, Z. Z. Wang, S. A. Lyon, D. C. Tsui, N. P. Ong, J. M. Tarascon, P. Barboux

研究成果: Contribution to journalArticle

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We have measured the room-temperature reflectivity of 90-K single crystals YBa2Cu3O7 in the frequency range 6009000 cm-1. The reflectivity R in these highly conducting samples (ab=150 cm at 290 K) is found to be higher than in previous reports. We fit R to a simple Drude-Lorentz model and compare the fit parameters with the dc transport values. (The effective-mass ratio of the carriers is found to be 2.0, and the scattering rate Latin small letter h with stroke/ is 3.1kBT at room temperature.) Ellipsometry measurements have also been performed using transverse-electric and transverse-magnetic polarizations. The dielectric dispersion derived from ellipsometry shows some important deviations from the Drude-Lorentz model. Reflectivity data from nonsuperconducting crystals of Bi2Sr2CuO6+y are also reported.

元の言語英語
ページ(範囲)6884-6889
ページ数6
ジャーナルPhysical Review B
40
発行部数10
DOI
出版物ステータス出版済み - 1 1 1989
外部発表Yes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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    Watanabe, Y., Wang, Z. Z., Lyon, S. A., Tsui, D. C., Ong, N. P., Tarascon, J. M., & Barboux, P. (1989). Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa2Cu3O7 and Bi2Sr2CuO6+y. Physical Review B, 40(10), 6884-6889. https://doi.org/10.1103/PhysRevB.40.6884