Molecular aggregation structure of polyethylene thin films prepared on silicon substrates

Sono Sasaki, Hirohiko Yakabe, Keiji Tanaka, Toshihiko Nagamura, Osami Sakata, Masaki Takata, Atsushi Takahara, Tisato Kajiyama

研究成果: 会議への寄与タイプ学会誌査読


In this study, structural features of crystalline polymers at the solid surface were analyzed by synchrotron grazing-incidence X-ray diffraction (SR-GIXD) measurements. Thin films of high-density polyethylene (HDPE) were prepared on silicon substrates from a p-xylene solution by a dip-coating method. The dip-coated films and the dip-coated and melt-crystallized ones were annealed at temperatures (Ta) of 373K-393K under N 2 atmosphere. The in-plane GIXD measurement for the HDPE thin films was carried out at the BL13XU of SPring-8, Japan. Bragg diffraction from the near-surface and the bulk of the films was detected at incident angles smaller and larger than the critical angle, respectively. Comparison of the surface-sensitive GIXD data with the bulk one revealed that the dimensions of orthorhombic unit cell in the near-surface region were smaller than those in the bulk region. This might relate to thermal stress induced between the HDPE film and the silicon substrate in film preparation.

出版ステータス出版済み - 12月 1 2005
イベント54th SPSJ Symposium on Macromolecules - Yamagata, 日本
継続期間: 9月 20 20059月 22 2005


その他54th SPSJ Symposium on Macromolecules

!!!All Science Journal Classification (ASJC) codes

  • 工学(全般)


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