Morphology and mechanical properties of polymer surfaces via scanning force microscopy

T. Kajiyama, Keiji Tanaka, S. R. Ge, Atsushi Takahara

研究成果: ジャーナルへの寄稿評論記事

54 引用 (Scopus)

抄録

Scanning force microscopy is used in studies of the surface morphology and surface mechanical properties of polymeric solids. Several examples are presented to illustrate that SFM is a powerful and promising tool for investigations, such as, polyethylene single crystal, polymer blend thin films and polymerized organosilane monolayers. The imaging of nano-mechanical properties, such as, lateral force and elastic modulus of phase-separated polymer surfaces by SFM is presented. The application of SFM to the quantitative evaluation of surface viscoelasticity is also summarized.

元の言語英語
ページ(範囲)1-52
ページ数52
ジャーナルProgress in Surface Science
52
発行部数1
DOI
出版物ステータス出版済み - 1 1 1996

Fingerprint

Atomic force microscopy
Polymers
mechanical properties
microscopy
Mechanical properties
scanning
polymers
Viscoelasticity
Polyethylene
Polymer blends
Surface morphology
Polyethylenes
polymer blends
Monolayers
viscoelasticity
Elastic moduli
Single crystals
Imaging techniques
polyethylenes
Thin films

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

これを引用

Morphology and mechanical properties of polymer surfaces via scanning force microscopy. / Kajiyama, T.; Tanaka, Keiji; Ge, S. R.; Takahara, Atsushi.

:: Progress in Surface Science, 巻 52, 番号 1, 01.01.1996, p. 1-52.

研究成果: ジャーナルへの寄稿評論記事

@article{d6ac4802ad054fd5ba4efa03413bfcf4,
title = "Morphology and mechanical properties of polymer surfaces via scanning force microscopy",
abstract = "Scanning force microscopy is used in studies of the surface morphology and surface mechanical properties of polymeric solids. Several examples are presented to illustrate that SFM is a powerful and promising tool for investigations, such as, polyethylene single crystal, polymer blend thin films and polymerized organosilane monolayers. The imaging of nano-mechanical properties, such as, lateral force and elastic modulus of phase-separated polymer surfaces by SFM is presented. The application of SFM to the quantitative evaluation of surface viscoelasticity is also summarized.",
author = "T. Kajiyama and Keiji Tanaka and Ge, {S. R.} and Atsushi Takahara",
year = "1996",
month = "1",
day = "1",
doi = "10.1016/0079-6816(96)00006-8",
language = "English",
volume = "52",
pages = "1--52",
journal = "Progress in Surface Science",
issn = "0079-6816",
publisher = "Elsevier Limited",
number = "1",

}

TY - JOUR

T1 - Morphology and mechanical properties of polymer surfaces via scanning force microscopy

AU - Kajiyama, T.

AU - Tanaka, Keiji

AU - Ge, S. R.

AU - Takahara, Atsushi

PY - 1996/1/1

Y1 - 1996/1/1

N2 - Scanning force microscopy is used in studies of the surface morphology and surface mechanical properties of polymeric solids. Several examples are presented to illustrate that SFM is a powerful and promising tool for investigations, such as, polyethylene single crystal, polymer blend thin films and polymerized organosilane monolayers. The imaging of nano-mechanical properties, such as, lateral force and elastic modulus of phase-separated polymer surfaces by SFM is presented. The application of SFM to the quantitative evaluation of surface viscoelasticity is also summarized.

AB - Scanning force microscopy is used in studies of the surface morphology and surface mechanical properties of polymeric solids. Several examples are presented to illustrate that SFM is a powerful and promising tool for investigations, such as, polyethylene single crystal, polymer blend thin films and polymerized organosilane monolayers. The imaging of nano-mechanical properties, such as, lateral force and elastic modulus of phase-separated polymer surfaces by SFM is presented. The application of SFM to the quantitative evaluation of surface viscoelasticity is also summarized.

UR - http://www.scopus.com/inward/record.url?scp=0030143316&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030143316&partnerID=8YFLogxK

U2 - 10.1016/0079-6816(96)00006-8

DO - 10.1016/0079-6816(96)00006-8

M3 - Review article

AN - SCOPUS:0030143316

VL - 52

SP - 1

EP - 52

JO - Progress in Surface Science

JF - Progress in Surface Science

SN - 0079-6816

IS - 1

ER -