Multi-scale Monte Carlo simulation of soft errors using PHITS-HyENEXSS code system

Shin Ichiro Abe, Yukinobu Watanabe, Nozomi Shibano, Nobuyuki Sano, Hiroshi Furuta, Masafumi Tsutsui, Taiki Uemura, Takahiko Arakawa

研究成果: 書籍/レポート タイプへの寄稿会議への寄与

3 被引用数 (Scopus)

抄録

We have proposed a multi-scale Monte Carlo simulation method of neutron induced soft errors by linking a particle transport code PHITS and a 3-D TCAD simulator HyENEXSS. An interface tool between PHITS and HyENEXSS is developed to generate the mesh structure optimized for an event where multiple secondary ions extending to arbitrary directions are generated simultaneously by neutron incidence on device. Using the interface tool, we have made it possible to perform the Monte Carlo calculation of soft error rates (SERs) based on event-by-event device simulation. The PHITS-HyENEXSS code system has been successfully applied to SER analyses for 65 nm, 45 nm, and 32 nm technology MOSFETs.

本文言語英語
ホスト出版物のタイトルRADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings
ページ390-395
ページ数6
DOI
出版ステータス出版済み - 2011
イベント12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 - Sevilla, スペイン
継続期間: 9月 19 20119月 23 2011

出版物シリーズ

名前Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

その他

その他12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011
国/地域スペイン
CitySevilla
Period9/19/119/23/11

!!!All Science Journal Classification (ASJC) codes

  • 放射線
  • 電子工学および電気工学

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