Multi-scale monte carlo simulation of soft errors using PHITS-HyENEXSS code system

Shin Ichiro Abe, Yukinobu Watanabe, Nozomi Shibano, Nobuyuki Sano, Hiroshi Furuta, Masafumi Tsutsui, Taiki Uemura, Takahiko Arakawa

研究成果: ジャーナルへの寄稿記事

25 引用 (Scopus)

抄録

We have proposed a multi-scale Monte Carlo simulation method of neutron induced soft errors by linking a particle transport code PHITS and a 3-D TCAD simulator HyENEXSS. An interface tool between PHITS and HyENEXSS is developed to generate the mesh structure optimized for an event where multiple secondary ions extending to arbitrary directions are generated simultaneously by neutron incidence on device. Using the interface tool, we have made it possible to perform the Monte Carlo calculation of soft error rates (SERs) based on event-by-event device simulation. The PHITS-HyENEXSS code system has been successfully applied to SER analyses for 65 nm, 45 nm, and 32 nm technology MOSFETs.

元の言語英語
記事番号6170578
ページ(範囲)965-970
ページ数6
ジャーナルIEEE Transactions on Nuclear Science
59
発行部数4 PART 1
DOI
出版物ステータス出版済み - 3 21 2012

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Neutrons
neutrons
simulation
simulators
mesh
field effect transistors
incidence
Simulators
Ions
Monte Carlo simulation
ions

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

これを引用

Abe, S. I., Watanabe, Y., Shibano, N., Sano, N., Furuta, H., Tsutsui, M., ... Arakawa, T. (2012). Multi-scale monte carlo simulation of soft errors using PHITS-HyENEXSS code system. IEEE Transactions on Nuclear Science, 59(4 PART 1), 965-970. [6170578]. https://doi.org/10.1109/TNS.2012.2187215

Multi-scale monte carlo simulation of soft errors using PHITS-HyENEXSS code system. / Abe, Shin Ichiro; Watanabe, Yukinobu; Shibano, Nozomi; Sano, Nobuyuki; Furuta, Hiroshi; Tsutsui, Masafumi; Uemura, Taiki; Arakawa, Takahiko.

:: IEEE Transactions on Nuclear Science, 巻 59, 番号 4 PART 1, 6170578, 21.03.2012, p. 965-970.

研究成果: ジャーナルへの寄稿記事

Abe, SI, Watanabe, Y, Shibano, N, Sano, N, Furuta, H, Tsutsui, M, Uemura, T & Arakawa, T 2012, 'Multi-scale monte carlo simulation of soft errors using PHITS-HyENEXSS code system', IEEE Transactions on Nuclear Science, 巻. 59, 番号 4 PART 1, 6170578, pp. 965-970. https://doi.org/10.1109/TNS.2012.2187215
Abe, Shin Ichiro ; Watanabe, Yukinobu ; Shibano, Nozomi ; Sano, Nobuyuki ; Furuta, Hiroshi ; Tsutsui, Masafumi ; Uemura, Taiki ; Arakawa, Takahiko. / Multi-scale monte carlo simulation of soft errors using PHITS-HyENEXSS code system. :: IEEE Transactions on Nuclear Science. 2012 ; 巻 59, 番号 4 PART 1. pp. 965-970.
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