Nanometer-scale surface element analysis in polymers using laser ablation atomic fluorescence spectroscopy

Min Kyu Kim, Hiroyuki Ishii, Kazuyoshi Taoka, Yuji Oki, Mitsuo Maeda

研究成果: Contribution to journalArticle査読

18 被引用数 (Scopus)

抄録

In this paper, laser ablation atomic fluorescence (LAAF) spectroscopy has been applied for a nanometer-scale solid surface analysis of Na-doped polymethyl methacrylate (PMMA). LAAF spectroscopy is a new sensitive element detection technique which involves atomizing of a sample by the laser ablation and detection of the ablated plume by laser-induced fluorescence (LIF) spectroscopy. Using this technique in the detection of Na atoms with a sample of Na-doped PMMA, an ablation rate of 4.4 nm/shot is attained and a detection limit is estimated to be 36 fg for a single laser shot. Further, a two-layer PMMA sample is ablated and by observing the shot-by-shot LIF intensity from Na atoms, the depth distribution in the sample is measured with a very high spatial resolution.

本文言語英語
ページ(範囲)1029-1033
ページ数5
ジャーナルJournal of Applied Physics
87
3
DOI
出版ステータス出版済み - 2 1 2000

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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