TY - GEN
T1 - Nanopore formation on SOI(100) by CH3SiH3 pulse jet CVD:SiC growth temperature dependence
AU - Ikoma, Yoshifumi
AU - Nishino, Yuta
AU - Anan, Shouhei
AU - Abe, Toshiaki
AU - Sakita, Hirofumi
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2013
Y1 - 2013
N2 - We investigated the formation of nanopores on top Si layers of silicon on insulatorsubstrates by CH3SiH3 pulse jet chemical vapor deposition. Nanopores were obtained by chemicaletching of the buried oxide layer below the pits which were introduced during the SiC growth. Thehigh nanopore density was obtained when the SiC growth temperature was set at 925 °C. Thenanopore density gradually decreased with increasing the temperature at higher SiC growthtemperature. The pore size increased with increasing the SiC growth temperature. These resultssuggest that pore density and size strongly depend on the SiC growth temperature.
AB - We investigated the formation of nanopores on top Si layers of silicon on insulatorsubstrates by CH3SiH3 pulse jet chemical vapor deposition. Nanopores were obtained by chemicaletching of the buried oxide layer below the pits which were introduced during the SiC growth. Thehigh nanopore density was obtained when the SiC growth temperature was set at 925 °C. Thenanopore density gradually decreased with increasing the temperature at higher SiC growthtemperature. The pore size increased with increasing the SiC growth temperature. These resultssuggest that pore density and size strongly depend on the SiC growth temperature.
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U2 - 10.4028/www.scientific.net/MSF.750.252
DO - 10.4028/www.scientific.net/MSF.750.252
M3 - Conference contribution
AN - SCOPUS:84875822716
SN - 9783037856604
T3 - Materials Science Forum
SP - 252
EP - 255
BT - Advanced Materials Science and Technology
PB - Trans Tech Publications Ltd
T2 - 8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
Y2 - 1 August 2012 through 4 August 2012
ER -