Nanoscale characterization of epoxy interface on silica

Kenji Okamoto, Tatsuya Ganbe, Nobuyuki Sekine, Mika Aoki, Manabu Inutsuka, Atsuomi Shundo, Daisuke Kawaguchi, Keiji Tanaka

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

1 被引用数 (Scopus)

抄録

The objective of this study is to carry out nanoscale characterization of the epoxy resin interface on silica by determining the glass-transition temperature (Tg) and molecular conformation at the interface by means of a novel non-destructive method. The Tg was determined by fluorescence lifetime measurements using evanescent wave excitation. It was revealed that the Tg of epoxy resin at a distance of 30 nm from the interface was 10 K higher than that at a distance of 80 nm. The chemical composition and molecular conformation were analysed by X-ray photoelectron spectroscopy and sum-frequency generation (SFG) spectroscopy, respectively. The SFG data revealed that unreacted epoxy group remained at the interface. The Tg of epoxy resin increased in the regions near the interface, and the epoxy group remained unreacted at a distance of ca. 10 nm or less from the interface.

本文言語英語
ホスト出版物のタイトルProceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016
出版社Institute of Electrical and Electronics Engineers Inc.
ページ84-87
ページ数4
1
ISBN(電子版)9781509028023
DOI
出版ステータス出版済み - 8 18 2016
イベント1st IEEE International Conference on Dielectrics, ICD 2016 - Montpellier, フランス
継続期間: 7 3 20167 7 2016

その他

その他1st IEEE International Conference on Dielectrics, ICD 2016
国/地域フランス
CityMontpellier
Period7/3/167/7/16

All Science Journal Classification (ASJC) codes

  • ポリマーおよびプラスチック
  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学
  • セラミックおよび複合材料

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