Nanoscale characterization of epoxy interface on silica

Kenji Okamoto, Tatsuya Ganbe, Nobuyuki Sekine, Mika Aoki, Manabu Inutsuka, Atsuomi Shundo, Daisuke Kawaguchi, Keiji Tanaka

研究成果: 著書/レポートタイプへの貢献会議での発言

1 引用 (Scopus)

抄録

The objective of this study is to carry out nanoscale characterization of the epoxy resin interface on silica by determining the glass-transition temperature (Tg) and molecular conformation at the interface by means of a novel non-destructive method. The Tg was determined by fluorescence lifetime measurements using evanescent wave excitation. It was revealed that the Tg of epoxy resin at a distance of 30 nm from the interface was 10 K higher than that at a distance of 80 nm. The chemical composition and molecular conformation were analysed by X-ray photoelectron spectroscopy and sum-frequency generation (SFG) spectroscopy, respectively. The SFG data revealed that unreacted epoxy group remained at the interface. The Tg of epoxy resin increased in the regions near the interface, and the epoxy group remained unreacted at a distance of ca. 10 nm or less from the interface.

元の言語英語
ホスト出版物のタイトルProceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016
出版者Institute of Electrical and Electronics Engineers Inc.
ページ84-87
ページ数4
1
ISBN(電子版)9781509028023
DOI
出版物ステータス出版済み - 8 18 2016
イベント1st IEEE International Conference on Dielectrics, ICD 2016 - Montpellier, フランス
継続期間: 7 3 20167 7 2016

その他

その他1st IEEE International Conference on Dielectrics, ICD 2016
フランス
Montpellier
期間7/3/167/7/16

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Epoxy Resins
Epoxy resins
Silicon Dioxide
Silica
Conformations
X ray photoelectron spectroscopy
Fluorescence
Spectroscopy
Chemical analysis

All Science Journal Classification (ASJC) codes

  • Polymers and Plastics
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Ceramics and Composites

これを引用

Okamoto, K., Ganbe, T., Sekine, N., Aoki, M., Inutsuka, M., Shundo, A., ... Tanaka, K. (2016). Nanoscale characterization of epoxy interface on silica. : Proceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016 (巻 1, pp. 84-87). [7547549] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICD.2016.7547549

Nanoscale characterization of epoxy interface on silica. / Okamoto, Kenji; Ganbe, Tatsuya; Sekine, Nobuyuki; Aoki, Mika; Inutsuka, Manabu; Shundo, Atsuomi; Kawaguchi, Daisuke; Tanaka, Keiji.

Proceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016. 巻 1 Institute of Electrical and Electronics Engineers Inc., 2016. p. 84-87 7547549.

研究成果: 著書/レポートタイプへの貢献会議での発言

Okamoto, K, Ganbe, T, Sekine, N, Aoki, M, Inutsuka, M, Shundo, A, Kawaguchi, D & Tanaka, K 2016, Nanoscale characterization of epoxy interface on silica. : Proceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016. 巻. 1, 7547549, Institute of Electrical and Electronics Engineers Inc., pp. 84-87, 1st IEEE International Conference on Dielectrics, ICD 2016, Montpellier, フランス, 7/3/16. https://doi.org/10.1109/ICD.2016.7547549
Okamoto K, Ganbe T, Sekine N, Aoki M, Inutsuka M, Shundo A その他. Nanoscale characterization of epoxy interface on silica. : Proceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016. 巻 1. Institute of Electrical and Electronics Engineers Inc. 2016. p. 84-87. 7547549 https://doi.org/10.1109/ICD.2016.7547549
Okamoto, Kenji ; Ganbe, Tatsuya ; Sekine, Nobuyuki ; Aoki, Mika ; Inutsuka, Manabu ; Shundo, Atsuomi ; Kawaguchi, Daisuke ; Tanaka, Keiji. / Nanoscale characterization of epoxy interface on silica. Proceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016. 巻 1 Institute of Electrical and Electronics Engineers Inc., 2016. pp. 84-87
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