Near-field scanning optical microscopic transient lens for carrier dynamics study in InGaNGaN

Koichi Okamoto, Axel Scherer, Yoichi Kawakami

研究成果: Contribution to journalArticle査読

36 被引用数 (Scopus)

抄録

Time-resolved microscopic transient lens (TR-M-TL) and near-field scanning optical microscopic transient lens (NSOM-TL) were performed to reveal temporal and spatial behavior of carrier dynamics in InGaNGaN quantum wells. The carrier and thermal dynamics were observed through the time profile of the TR-M-TL signal. Also, NSOM-photoluminescence and NSOM-TL images were observed at the same time. By comparing these two images, both radiative and nonradiative recombination centers in InGaN active layer were unambiguously discriminated with submicrometer scale. Such nonradiative carrier dynamics has been difficult to observe by conventional techniques in spite of its importance.

本文言語英語
論文番号161104
ページ(範囲)1-3
ページ数3
ジャーナルApplied Physics Letters
87
16
DOI
出版ステータス出版済み - 10 17 2005
外部発表はい

All Science Journal Classification (ASJC) codes

  • 物理学および天文学(その他)

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