抄録
Time-resolved microscopic transient lens (TR-M-TL) and near-field scanning optical microscopic transient lens (NSOM-TL) were performed to reveal temporal and spatial behavior of carrier dynamics in InGaNGaN quantum wells. The carrier and thermal dynamics were observed through the time profile of the TR-M-TL signal. Also, NSOM-photoluminescence and NSOM-TL images were observed at the same time. By comparing these two images, both radiative and nonradiative recombination centers in InGaN active layer were unambiguously discriminated with submicrometer scale. Such nonradiative carrier dynamics has been difficult to observe by conventional techniques in spite of its importance.
本文言語 | 英語 |
---|---|
論文番号 | 161104 |
ページ(範囲) | 1-3 |
ページ数 | 3 |
ジャーナル | Applied Physics Letters |
巻 | 87 |
号 | 16 |
DOI | |
出版ステータス | 出版済み - 10月 17 2005 |
外部発表 | はい |
!!!All Science Journal Classification (ASJC) codes
- 物理学および天文学(その他)