Novel methodology for reproducibility of OLED lifetimes and identification of killer impurities

Hiroshi Fujimoto, Toshimitsu Nakamum, Kaori Nagayoshi, Kentaro Harada, Hiroshi Miyazaki, Takaomi Kurata, Junya Kiyota, Chihaya Adachi

研究成果: Contribution to journalConference article査読

抄録

A new method to investigate the influence of vacuum chamber impurities on OLED lifetime is demonstrated. By combining deposition from a novel-design crucible with in-situ exposure to impurity sources, and by controlling the amount of water impinging, we show that the influence of water and impurities can be separately examined.

本文言語英語
ページ(範囲)822-825
ページ数4
ジャーナルDigest of Technical Papers - SID International Symposium
51
1
DOI
出版ステータス出版済み - 2020
イベント57th SID International Symposium, Seminar and Exhibition, Display Week, 2020 - Virtual, Online
継続期間: 8 3 20208 7 2020

All Science Journal Classification (ASJC) codes

  • 工学(全般)

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