抄録
Extremely trace element analysis of solid surface using UV laser ablation technique has been developed and a simple numerical simulation of scattering atoms by laser ablation was performed. Calculation model shows a very good agreement with experimental results in a vacuum condition by using Maxwellian velocity distribution and forward peaked angular distribution. The atomic distribution in buffer gas was also investigated. Experiment with two dimensional imaging LIF spectroscopy and caluculation using Monte Carlo simulation method were performed.
本文言語 | 英語 |
---|---|
ページ(範囲) | 63-67 |
ページ数 | 5 |
ジャーナル | Research Reports on Information Science and Electrical Engineering of Kyushu University |
巻 | 11 |
号 | 1 |
出版ステータス | 出版済み - 3月 2006 |
!!!All Science Journal Classification (ASJC) codes
- 電子工学および電気工学
- ハードウェアとアーキテクチャ
- 工学(その他)