Numerical study of the relationship between growth condition and atomic arrangement of InGaN

Y. Kangawa, K. Kakimoto, T. Ito, A. Koukltu

研究成果: ジャーナルへの寄稿学術誌査読

1 被引用数 (Scopus)

抄録

Monte Carlo simulations of InGaN MOVPE were carried out to investigate the relationship between growth conditions and atomic arrangement in thin films grown on (0001) and (112̄0). In the case of small input partial pressures of indium, it was found that compositional instability was enhanced during the site exchanging process instead of the adsorption process. Moreover, it was found that compositional fluctuation in thin films grown on (112̄0) is smaller than that in thin films grown on (0001). This suggests that accumulated stress near the growth surface influences the compositional fluctuation.

本文言語英語
ページ(範囲)1784-1788
ページ数5
ジャーナルPhysica Status Solidi (B) Basic Research
244
6
DOI
出版ステータス出版済み - 6月 1 2007

!!!All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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