One-shot spectrometer for several elements using an integrated conical crystal analyzer

Kohei Morishita, Kouichi Hayashi, Kazuo Nakajima

研究成果: Contribution to journalReview article査読

4 被引用数 (Scopus)

抄録

Time-resolved x-ray spectrometry using an ultrastrong x-ray source such as an x-ray free electron laser is one of the new trends in the field of x-ray physics. To achieve such time-resolved measurement, the development of an one-shot spectrometer with a wide wavelength range, high efficiency, and good energy resolution is an essential prerequisite. Here we developed an integrated conical Ge crystal analyzer consisting of several conical rings, which were connected using spline surfaces to form a single body using our previously developed hot deformation technique, which can form a Si or Ge wafer into an arbitrary and accurate shape. We simultaneously focused several characteristic lines from an alloy sample onto different positions on a small x-ray charge-coupled device with very high image brightness (gain relative to planar analyzer: 100) and a good spatial resolution of 9-13 eV. The small radius of curvature of the crystal (28-50 mm) enabled us to realize a very short sample-detector distance of 214.4 mm. The present result shows the possibility of realizing a new focusing x-ray crystal spectrograph that can control the focal position as desired.

本文言語英語
論文番号013112
ジャーナルReview of Scientific Instruments
83
1
DOI
出版ステータス出版済み - 1 2012
外部発表はい

All Science Journal Classification (ASJC) codes

  • 器械工学

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