Optical-beam-induced-current analysis of wear-out degradation in high-reliability Fabry-Perot laser diodes for access networks

Tsuyoshi Ito, Tatsuya Takeshita, Mitsuru Sugo, Takeshi Kurosaki, Yuji Akatsu, Kazutoshi Kato

研究成果: Contribution to journalArticle査読

3 被引用数 (Scopus)

抄録

Reliability of a Fabry-Perot laser diode (FP-LD) that was developed for use in the bi-directional optical subassembly of access networks was investigated. Stable operation, which was closely related to the wear-out degradation, was confirmed from the results of an accelerated aging test at 85 °C, and a lifetime of over 2 × 105 h was estimated. To examine the behavior of the wear-out degradation in the FP-LD, we employed an optical-beam-induced-current (OBIC) analysis. From the results of the OBIC analysis, we found that large degradation occurs in the SCH layer rather than in the active layer in the early stage of the FP-LD's life.

本文言語英語
ページ(範囲)4523-4526
ページ数4
ジャーナルJapanese Journal of Applied Physics
47
6 PART 1
DOI
出版ステータス出版済み - 6 13 2008
外部発表はい

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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