Optical full-field strain measurement method from wrapped sampling Moiré phase to minimize the influence of defects and its applications

Qinghua Wang, Shien Ri, Hiroshi Tsuda, Motomichi Koyama

研究成果: ジャーナルへの寄稿学術誌査読

22 被引用数 (Scopus)

抄録

For strain measurement in the case of complex situations such as when defects (including cracks, notches and stains) exist, the traditional phase unwrapping algorithm will bring great error in strain distributions around defects. In this study, a simple local phase unwrapping algorithm was proposed to minimize the influence of defects on full-field strain measurement. From the specimen grid images before and after deformation, the Moiré phases are first acquired by the sampling Moiré technique. The wrapped Moiré phase difference is then calculated to determine the strain distributions by only unwrapping the phase difference at the boundaries of the wrapped phase. In other words, the partial differentials of the Moiré phase difference are corrected by local phase compensation for strain calculation. The accuracy of the developed strain measurement method was verified from numerical simulations. As applications, this method was successfully used in microscale strain distribution measurements of an aluminum specimen with a prefabricated crack and several grid defects under tensile loading, and a titanium alloy specimen with a prefabricated notch and an emerged irregular crack under tensile-fatigue loading. The local phase unwrapping algorithm can also be integrated with geometric phase analysis for strain measurement.

本文言語英語
ページ(範囲)155-162
ページ数8
ジャーナルOptics and Lasers in Engineering
110
DOI
出版ステータス出版済み - 11月 2018

!!!All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 原子分子物理学および光学
  • 機械工学
  • 電子工学および電気工学

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