抄録
The development of plasma-sputter-type negative ion sources is underway for the heavy-ion-beam probe system as plasma diagnostic beams of the large helical device (LHD) for potential and fluctuation field measurements. Our purpose is to increase the doubly charged exchanged Au+ beam intensity to enhance the detection signal after passing through the plasmas of the LHD. For this purpose, the characterization of the Au- ion source and the beam optics has been carried out both experimentally and numerically. Based on these results, a new plasma-sputter-type negative ion source is designed and tested.
本文言語 | 英語 |
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論文番号 | 03A537 |
ジャーナル | Review of Scientific Instruments |
巻 | 77 |
号 | 3 |
DOI | |
出版ステータス | 出版済み - 3 2006 |
All Science Journal Classification (ASJC) codes
- Instrumentation