Optimization of negative ion sources for a heavy-ion-beam probe

M. Nishiura, T. Ido, A. Shimizu, S. Kato, K. Tsukada, A. Nishizawa, Y. Hamada, Y. Matsumoto, A. Mendenilla, M. Wada

研究成果: Contribution to journalArticle査読

8 被引用数 (Scopus)

抄録

The development of plasma-sputter-type negative ion sources is underway for the heavy-ion-beam probe system as plasma diagnostic beams of the large helical device (LHD) for potential and fluctuation field measurements. Our purpose is to increase the doubly charged exchanged Au+ beam intensity to enhance the detection signal after passing through the plasmas of the LHD. For this purpose, the characterization of the Au- ion source and the beam optics has been carried out both experimentally and numerically. Based on these results, a new plasma-sputter-type negative ion source is designed and tested.

本文言語英語
論文番号03A537
ジャーナルReview of Scientific Instruments
77
3
DOI
出版ステータス出版済み - 3 2006

All Science Journal Classification (ASJC) codes

  • Instrumentation

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