Oriented polysilane films evaporated on poly (tetrafluoroethylene) layer

Yukio Aoki, Reiji Hattori, Junji Shirafuji

研究成果: Chapter in Book/Report/Conference proceedingOther chapter contribution

抄録

Poly (dimethylsilane) (PDMS), poly (methylphenylsilane) (PMPS) and poly (cyclohexylmethylsilane) (PCHMS) were evaporated on the substrates coated with poly (tetrafluoroethylene) (PTFE). The oriented PTFE layer on substrates was formed by means of mechanical deposition technique. The orientation characteristics for polysilane films were estimated by polarizing microscope images, X-ray diffraction (XRD) patterns and polarized absorption spectra. The orientation characteristics were confirmed only in the poly (dimethylsilane) (PDMS) film on the PTFE layer. The oriented regions in the evaporated PDMS film were lain along the grooves with a several micron width formed on PTFE layer. The X-ray diffraction analysis indicated that the silicon backbone chains lie in a plain parallel to the substrate and that a particular crystalline plain is also parallel to the substrate.

本文言語英語
ホスト出版物のタイトルTechnology Reports of the Osaka University
出版社Osaka City Univ
ページ147-153
ページ数7
45
2217-2232
出版ステータス出版済み - 1 1 1995
外部発表はい

All Science Journal Classification (ASJC) codes

  • 工学(全般)

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