Poly (dimethylsilane) (PDMS), poly (methylphenylsilane) (PMPS) and poly (cyclohexylmethylsilane) (PCHMS) were evaporated on the substrates coated with poly (tetrafluoroethylene) (PTFE). The oriented PTFE layer on substrates was formed by means of mechanical deposition technique. The orientation characteristics for polysilane films were estimated by polarizing microscope images, X-ray diffraction (XRD) patterns and polarized absorption spectra. The orientation characteristics were confirmed only in the poly (dimethylsilane) (PDMS) film on the PTFE layer. The oriented regions in the evaporated PDMS film were lain along the grooves with a several micron width formed on PTFE layer. The X-ray diffraction analysis indicated that the silicon backbone chains lie in a plain parallel to the substrate and that a particular crystalline plain is also parallel to the substrate.
|ホスト出版物のタイトル||Technology Reports of the Osaka University|
|出版社||Osaka City Univ|
|出版ステータス||出版済み - 1 1 1995|
All Science Journal Classification (ASJC) codes