Orthogonal Fluxgate Magnetometer Utilizing Bias Switching for Stable Operation

Ichiro Sasada, Takashi Usui

研究成果: 会議への寄与タイプ論文

5 引用 (Scopus)

抄録

A new mode of operation is described for an orthogonal fluxgate built with a thin magnetic wire. In this mode, a dc bias is added to the ac excitation and the fundamental component of the induced voltage is a measure of the axially applied magnetic field. A bias switching method for reducing offset and drift is proposed for the orthogonal fluxgate operating in the new mode. Preliminary results on the resolution and the stability are presented.

元の言語英語
ページ468-471
ページ数4
出版物ステータス出版済み - 12 1 2003
イベントSecond International Conference on Sensors: IEEE Sensors 2003 - Toronto, Ont., カナダ
継続期間: 10 22 200310 24 2003

その他

その他Second International Conference on Sensors: IEEE Sensors 2003
カナダ
Toronto, Ont.
期間10/22/0310/24/03

Fingerprint

Magnetometers
Wire
Magnetic fields
Electric potential

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

これを引用

Sasada, I., & Usui, T. (2003). Orthogonal Fluxgate Magnetometer Utilizing Bias Switching for Stable Operation. 468-471. 論文発表場所 Second International Conference on Sensors: IEEE Sensors 2003, Toronto, Ont., カナダ.

Orthogonal Fluxgate Magnetometer Utilizing Bias Switching for Stable Operation. / Sasada, Ichiro; Usui, Takashi.

2003. 468-471 論文発表場所 Second International Conference on Sensors: IEEE Sensors 2003, Toronto, Ont., カナダ.

研究成果: 会議への寄与タイプ論文

Sasada, I & Usui, T 2003, 'Orthogonal Fluxgate Magnetometer Utilizing Bias Switching for Stable Operation', 論文発表場所 Second International Conference on Sensors: IEEE Sensors 2003, Toronto, Ont., カナダ, 10/22/03 - 10/24/03 pp. 468-471.
Sasada I, Usui T. Orthogonal Fluxgate Magnetometer Utilizing Bias Switching for Stable Operation. 2003. 論文発表場所 Second International Conference on Sensors: IEEE Sensors 2003, Toronto, Ont., カナダ.
Sasada, Ichiro ; Usui, Takashi. / Orthogonal Fluxgate Magnetometer Utilizing Bias Switching for Stable Operation. 論文発表場所 Second International Conference on Sensors: IEEE Sensors 2003, Toronto, Ont., カナダ.4 p.
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