Orthogonal fluxgate with annealed wire core

Mattia Butta, Ichiro Sasada

研究成果: Contribution to journalArticle査読

27 被引用数 (Scopus)

抄録

Orthogonal fluxgate in fundamental mode has become a competitive sensor for low noise measurement of low frequency magnetic fields. The noise of this sensor has been recently reduced to 2.8 pT Hz at 1 Hz; however, it appears that noise lower than 2.5 pT/ Hzat 1 Hz cannot be achieved because of the physical limitations due to the intrinsic noise generated in the core of the fluxgate. In order to decrease the noise below 2.5 pT/ Hzat 1 Hz, Barkhausen noise generated in the core must be reduced. For this purpose, we annealed the amorphous wire used as the core of the sensor in an infrared furnace while a dc current was flowing through the wire. The dc current generated a circumferential field large enough to saturate the wire in a circumferential direction, and by annealing the saturated wire, we increased the circumferential anisotropy. We illustrate the dependence of circumferential anisotropy on dc current in the wire as well as on temperature and time of annealing. We then demonstrate that larger circumferential anisotropy helps reduce the noise of the sensor suppressing the Barkhausen noise when the fluxgate is operated in fundamental mode. As a result, a 1.8 pT/ Hznoise at 1 Hz was achieved with annealed wire, which is far below the 2.5 pT/ Hzminimum noise achievable for sensors with as-cast wires.

本文言語英語
論文番号6392355
ページ(範囲)62-65
ページ数4
ジャーナルIEEE Transactions on Magnetics
49
1
DOI
出版ステータス出版済み - 2013

All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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